Paper Defect Detection

Model Description

This model is designed for automated surface defect detection in manufacturing using a hybrid approach that combines classical machine learning and deep learning techniques.

Model Architecture

The model uses a hybrid architecture combining:

Logistic Regression
SVM
Naive Bayes
CNN
Ensemble Voting Classifier

Feature Extraction Methods

Histogram of Oriented Gradients (HOG)
Gabor Filters
Canny Edge Detection
Wavelet Transforms

Performance

Model	Train Accuracy	Test Accuracy
Logistic Regression	0.99	0.79
SVM	0.86	0.80
Ensemble Model	0.90	0.81

Limitations

Performance may degrade for defect types not represented in the training data
Variations in lighting or textures can affect classification accuracy
This was a university project with room for improvement