id
stringlengths 9
16
| submitter
stringlengths 1
64
⌀ | authors
stringlengths 4
14.5k
| title
stringlengths 1
278
| comments
stringlengths 1
762
⌀ | journal-ref
stringlengths 1
557
⌀ | doi
stringlengths 11
153
⌀ | report-no
stringlengths 2
479
⌀ | categories
stringlengths 5
104
| license
stringclasses 9
values | abstract
stringlengths 6
3.8k
| versions
listlengths 1
103
| update_date
timestamp[s] | authors_parsed
sequencelengths 1
942
| categories_descriptions
listlengths 1
13
|
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
0710.4657 | EDA Publishing Association | Gh. Bodean, D. Bodean, A. Labunetz | New Schemes for Self-Testing RAM | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper gives an overview of a new technique, named pseudo-ring testing
(PRT). PRT can be applied for testing wide type of random access memories
(RAM): bit- or word-oriented and single- or dual-port RAM's. An essential
particularity of the proposed methodology is the emulation of a linear
automaton over Galois field by memory own components.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:34:59 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Bodean",
"Gh.",
""
],
[
"Bodean",
"D.",
""
],
[
"Labunetz",
"A.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4658 | EDA Publishing Association | A. M. Molnos, M. J. M. Heijligers, S. D. Cotofana, J. T. J. Van
Eijndhoven | Compositional Memory Systems for Multimedia Communicating Tasks | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR cs.MM | null | Conventional cache models are not suited for real-time parallel processing
because tasks may flush each other's data out of the cache in an unpredictable
manner. In this way the system is not compositional so the overall performance
is difficult to predict and the integration of new tasks expensive. This paper
proposes a new method that imposes compositionality to the system?s performance
and makes different memory hierarchy optimizations possible for multimedia
communicating tasks when running on embedded multiprocessor architectures. The
method is based on a cache allocation strategy that assigns sets of the unified
cache exclusively to tasks and to the communication buffers. We also
analytically formulate the problem and describe a method to compute the cache
partitioning ratio for optimizing the throughput and the consumed power. When
applied to a multiprocessor with memory hierarchy our technique delivers also
performance gain. Compared to the shared cache case, for an application
consisting of two jpeg decoders and one edge detection algorithm 5 times less
misses are experienced and for an mpeg2 decoder 6.5 times less misses are
experienced.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:35:10 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Molnos",
"A. M.",
""
],
[
"Heijligers",
"M. J. M.",
""
],
[
"Cotofana",
"S. D.",
""
],
[
"Van Eijndhoven",
"J. T. J.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
},
{
"class": "Computer Science",
"code": "cs.MM",
"description": "Roughly includes material in ACM Subject Class H.5.1.",
"span": "(Multimedia)"
}
] |
0710.4659 | EDA Publishing Association | Pierre Bomel (LESTER), Eric Martin (LESTER), Emmanuel Boutillon
(LESTER) | Synchronization Processor Synthesis for Latency Insensitive Systems | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | In this paper we present our contribution in terms of synchronization
processor for a SoC design methodology based on the theory of the latency
insensitive systems (LIS) of Carloni et al. Our contribution consists in IP
encapsulation into a new wrapper model which speed and area are optimized and
synthetizability guarantied. The main benefit of our approach is to preserve
the local IP performances when encapsulating them and reduce SoC silicon area.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:35:37 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Bomel",
"Pierre",
"",
"LESTER"
],
[
"Martin",
"Eric",
"",
"LESTER"
],
[
"Boutillon",
"Emmanuel",
"",
"LESTER"
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4660 | EDA Publishing Association | W.-L. Hung, Y. Xie, N. Vijaykrishnan, M. Kandemir, M. J. Irwin | Thermal-Aware Task Allocation and Scheduling for Embedded Systems | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Temperature affects not only the reliability but also the performance, power,
and cost of the embedded system. This paper proposes a thermal-aware task
allocation and scheduling algorithm for embedded systems. The algorithm is used
as a sub-routine for hardware/software co-synthesis to reduce the peak
temperature and achieve a thermally even distribution while meeting real time
constraints. The paper investigates both power-aware and thermal-aware
approaches to task allocation and scheduling. The experimental results show
that the thermal-aware approach outperforms the power-aware schemes in terms of
maximal and average temperature reductions. To the best of our knowledge, this
is the first task allocation and scheduling algorithm that takes temperature
into consideration.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:36:55 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Hung",
"W. -L.",
""
],
[
"Xie",
"Y.",
""
],
[
"Vijaykrishnan",
"N.",
""
],
[
"Kandemir",
"M.",
""
],
[
"Irwin",
"M. J.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4661 | EDA Publishing Association | C. Chiang, A. Kahng, S. Sinha, X. Xu, A. Zelikovsky | Bright-Field AAPSM Conflict Detection and Correction | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | As feature sizes shrink, it will be necessary to use AAPSM
(Alternating-Aperture Phase Shift Masking) to image critical features,
especially on the polysilicon layer. This imposes additional constraints on the
layouts beyond traditional design rules. Of particular note is the requirement
that all critical features be flanked by opposite-phase shifters, while the
shifters obey minimum width and spacing requirements. A layout is called
phase-assignable if it satisfies this requirement. If a layout is not
phase-assignable, the phase conflicts have to removed to enable the use of
AAPSM for the layout. Previous work has sought to detect a suitable set of
phase Conflicts to be removed, as well as correct them. The contribution of
this paper are the following: (1) a new approach to detect a minimal set of
phase conflicts (also referred to as AAPSM conflicts), which when corrected
will produce a phase-assignable layout; (2) a novel layout modification scheme
for correcting these AAPSM conflicts. The proposed approach for conflict
detection shows significant improvements in the quality of results and runtime
for real industrial circuits, when compared to previous methods. To the best of
our knowledge, this is the first time layout modification results are presented
for bright-field AAPSM. Our experiments show that the percentage area increase
for making a layout phase-assignable ranges from 0.7-11.8%.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:37:31 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Chiang",
"C.",
""
],
[
"Kahng",
"A.",
""
],
[
"Sinha",
"S.",
""
],
[
"Xu",
"X.",
""
],
[
"Zelikovsky",
"A.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4663 | EDA Publishing Association | Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, Nilanjan Banerjee,
Kaushik Roy | Statistical Modeling of Pipeline Delay and Design of Pipeline under
Process Variation to Enhance Yield in sub-100nm Technologies | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Operating frequency of a pipelined circuit is determined by the delay of the
slowest pipeline stage. However, under statistical delay variation in sub-100nm
technology regime, the slowest stage is not readily identifiable and the
estimation of the pipeline yield with respect to a target delay is a
challenging problem. We have proposed analytical models to estimate yield for a
pipelined design based on delay distributions of individual pipe stages. Using
the proposed models, we have shown that change in logic depth and imbalance
between the stage delays can improve the yield of a pipeline. A statistical
methodology has been developed to optimally design a pipeline circuit for
enhancing yield. Optimization results show that, proper imbalance among the
stage delays in a pipeline improves design yield by 9% for the same area and
performance (and area reduction by about 8.4% under a yield constraint) over a
balanced design.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:41:06 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Datta",
"Animesh",
""
],
[
"Bhunia",
"Swarup",
""
],
[
"Mukhopadhyay",
"Saibal",
""
],
[
"Banerjee",
"Nilanjan",
""
],
[
"Roy",
"Kaushik",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4665 | EDA Publishing Association | Nicolo Manaresi, Gianni Medoro, Melanie Abonnenc, Vincent Auger, Paul
Vulto, Aldo Romani, Luigi Altomare, Marco Tartagni, Roberto Guerrieri | New Perspectives and Opportunities From the Wild West of Microelectronic
Biochips | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Application of Microelectronic to bioanalysis is an emerging field which
holds great promise. From the standpoint of electronic and system design,
biochips imply a radical change of perspective, since new, completely different
constraints emerge while other usual constraints can be relaxed. While
electronic parts of the system can rely on the usual established design-flow,
fluidic and packaging design, calls for a new approach which relies
significantly on experiments. We hereby make some general considerations based
on our experience in the development of biochips for cell analysis.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:43:31 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Manaresi",
"Nicolo",
""
],
[
"Medoro",
"Gianni",
""
],
[
"Abonnenc",
"Melanie",
""
],
[
"Auger",
"Vincent",
""
],
[
"Vulto",
"Paul",
""
],
[
"Romani",
"Aldo",
""
],
[
"Altomare",
"Luigi",
""
],
[
"Tartagni",
"Marco",
""
],
[
"Guerrieri",
"Roberto",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4666 | EDA Publishing Association | Malay K. Ganai, Aarti Gupta, Pranav Ashar | Verification of Embedded Memory Systems using Efficient Memory Modeling | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.LO | null | We describe verification techniques for embedded memory systems using
efficient memory modeling (EMM), without explicitly modeling each memory bit.
We extend our previously proposed approach of EMM in Bounded Model Checking
(BMC) for a single read/write port single memory system, to more commonly
occurring systems with multiple memories, having multiple read and write ports.
More importantly, we augment such EMM to providing correctness proofs, in
addition to finding real bugs as before. The novelties of our verification
approach are in a) combining EMM with proof-based abstraction that preserves
the correctness of a property up to a certain analysis depth of SAT-based BMC,
and b) modeling arbitrary initial memory state precisely and thereby, providing
inductive proofs using SAT-based BMC for embedded memory systems. Similar to
the previous approach, we construct a verification model by eliminating memory
arrays, but retaining the memory interface signals with their control logic and
adding constraints on those signals at every analysis depth to preserve the
data forwarding semantics. The size of these EMM constraints depends
quadratically on the number of memory accesses and the number of read and write
ports; and linearly on the address and data widths and the number of memories.
We show the effectiveness of our approach on several industry designs and
software programs.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:44:05 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Ganai",
"Malay K.",
""
],
[
"Gupta",
"Aarti",
""
],
[
"Ashar",
"Pranav",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.LO",
"description": "Covers all aspects of logic in computer science, including finite model theory, logics of programs, modal logic, and program verification. Programming language semantics should have Programming Languages as the primary subject area. Roughly includes material in ACM Subject Classes D.2.4, F.3.1, F.4.0, F.4.1, and F.4.2; some material in F.4.3 (formal languages) may also be appropriate here, although Computational Complexity is typically the more appropriate subject area.",
"span": "(Logic in Computer Science)"
}
] |
0710.4667 | EDA Publishing Association | Chien-Liang Chen, Jiing-Yuan Lin, Youn-Long Lin | Integration, Verification and Layout of a Complex Multimedia SOC | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR cs.MM | null | We present our experience of designing a single-chip controller for advanced
digital still camera from specification all the way to mass production. The
process involves collaboration with camera system designer, IP vendors, EDA
vendors, silicon wafer foundry, package and testing houses, and camera maker.
We also co-work with academic research groups to develop a JPEG codec IP and
memory BIST and SOC testing methodology. In this presentation, we cover the
problems encountered, our solutions, and lessons learned.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:44:47 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Chen",
"Chien-Liang",
""
],
[
"Lin",
"Jiing-Yuan",
""
],
[
"Lin",
"Youn-Long",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
},
{
"class": "Computer Science",
"code": "cs.MM",
"description": "Roughly includes material in ACM Subject Class H.5.1.",
"span": "(Multimedia)"
}
] |
0710.4669 | EDA Publishing Association | Cheng-Wen Wu | SOC Testing Methodology and Practice | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | On a commercial digital still camera (DSC) controller chip we practice a
novel SOC test integration platform, solving real problems in test scheduling,
test IO reduction, timing of functional test, scan IO sharing, embedded memory
built-in self-test (BIST), etc. The chip has been fabricated and tested
successfully by our approach. Test results justify that short test integration
cost, short test time, and small area overhead can be achieved. To support SOC
testing, a memory BIST compiler and an SOC testing integration system have been
developed.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:45:18 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Wu",
"Cheng-Wen",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4670 | EDA Publishing Association | Ilia Polian, Alejandro Czutro, Bernd Becker | Evolutionary Optimization in Code-Based Test Compression | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | We provide a general formulation for the code-based test compression problem
with fixed-length input blocks and propose a solution approach based on
Evolutionary Algorithms. In contrast to existing code-based methods, we allow
unspecified values in matching vectors, which allows encoding of arbitrary test
sets using a relatively small number of code-words. Experimental results for
both stuck-at and path delay fault test sets for ISCAS circuits demonstrate an
improvement compared to existing techniques.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:45:52 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Polian",
"Ilia",
""
],
[
"Czutro",
"Alejandro",
""
],
[
"Becker",
"Bernd",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4671 | EDA Publishing Association | Srinivasan Murali, Giovanni De Micheli | An Application-Specific Design Methodology for STbus Crossbar Generation | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | As the communication requirements of current and future Multiprocessor
Systems on Chips (MPSoCs) continue to increase, scalable communication
architectures are needed to support the heavy communication demands of the
system. This is reflected in the recent trend that many of the standard bus
products such as STbus, have now introduced the capability of designing a
crossbar with multiple buses operating in parallel. The crossbar configuration
should be designed to closely match the application traffic characteristics and
performance requirements. In this work we address this issue of
application-specific design of optimal crossbar (using STbus crossbar
architecture), satisfying the performance requirements of the application and
optimal binding of cores onto the crossbar resources. We present a simulation
based design approach that is based on analysis of actual traffic trace of the
application, considering local variations in traffic rates, temporal overlap
among traffic streams and criticality of traffic streams. Our methodology is
applied to several MPSoC designs and the resulting crossbar platforms are
validated for performance by cycle-accurate SystemC simulation of the designs.
The experimental case studies show large reduction in packet latencies (up to
7x) and large crossbar component savings (up to 3.5x) compared to traditional
design approaches.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:46:59 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Murali",
"Srinivasan",
""
],
[
"De Micheli",
"Giovanni",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4672 | EDA Publishing Association | Fei Su, Krishnendu Chakrabarty, Vamsee K. Pamula | Yield Enhancement of Digital Microfluidics-Based Biochips Using Space
Redundancy and Local Reconfiguration | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | As microfluidics-based biochips become more complex, manufacturing yield will
have significant influence on production volume and product cost. We propose an
interstitial redundancy approach to enhance the yield of biochips that are
based on droplet-based microfluidics. In this design method, spare cells are
placed in the interstitial sites within the microfluidic array, and they
replace neighboring faulty cells via local reconfiguration. The proposed design
method is evaluated using a set of concurrent real-life bioassays.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:47:40 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Su",
"Fei",
""
],
[
"Chakrabarty",
"Krishnendu",
""
],
[
"Pamula",
"Vamsee K.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4673 | EDA Publishing Association | Fei Su, Krishnendu Chakrabarty | Design of Fault-Tolerant and Dynamically-Reconfigurable Microfluidic
Biochips | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Microfluidics-based biochips are soon expected to revolutionize clinical
diagnosis, DNA sequencing, and other laboratory procedures involving molecular
biology. Most microfluidic biochips are based on the principle of continuous
fluid flow and they rely on permanently-etched microchannels, micropumps, and
microvalves. We focus here on the automated design of "digital" droplet-based
microfluidic biochips. In contrast to continuous-flow systems, digital
microfluidics offers dynamic reconfigurability; groups of cells in a
microfluidics array can be reconfigured to change their functionality during
the concurrent execution of a set of bioassays. We present a simulated
annealing-based technique for module placement in such biochips. The placement
procedure not only addresses chip area, but it also considers fault tolerance,
which allows a microfluidic module to be relocated elsewhere in the system when
a single cell is detected to be faulty. Simulation results are presented for a
case study involving the polymerase chain reaction.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 08:48:12 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Su",
"Fei",
""
],
[
"Chakrabarty",
"Krishnendu",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4678 | EDA Publishing Association | R. Thewes, C. Paulus, M. Schienle, F. Hofmann, A. Frey, R. Brederlow,
M. Augustyniak, M. Jenkner, B. Eversmann, P. Schindler-Bauer, M. Atzesberger,
B. Holzapfl, G. Beer, T. Haneder, H.-C. Hanke | CMOS-Based Biosensor Arrays | null | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | CMOS-based sensor array chips provide new and attractive features as compared
to today's standard tools for medical, diagnostic, and biotechnical
applications. Examples for molecule- and cell-based approaches and related
circuit design issues are discussed.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:02:53 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Thewes",
"R.",
""
],
[
"Paulus",
"C.",
""
],
[
"Schienle",
"M.",
""
],
[
"Hofmann",
"F.",
""
],
[
"Frey",
"A.",
""
],
[
"Brederlow",
"R.",
""
],
[
"Augustyniak",
"M.",
""
],
[
"Jenkner",
"M.",
""
],
[
"Eversmann",
"B.",
""
],
[
"Schindler-Bauer",
"P.",
""
],
[
"Atzesberger",
"M.",
""
],
[
"Holzapfl",
"B.",
""
],
[
"Beer",
"G.",
""
],
[
"Haneder",
"T.",
""
],
[
"Hanke",
"H. -C.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4679 | EDA Publishing Association | Himanshu Kaul, Dennis Sylvester, David Blaauw, Trevor Mudge, Todd
Austin | DVS for On-Chip Bus Designs Based on Timing Error Correction | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | On-chip buses are typically designed to meet performance constraints at
worst-case conditions, including process corner, temperature, IR-drop, and
neighboring net switching pattern. This can result in significant performance
slack at more typical operating conditions. In this paper, we propose a dynamic
voltage scaling (DVS) technique for buses, based on a double sampling latch
which can detect and correct for delay errors without the need for
retransmission. The proposed approach recovers the available slack at
non-worst-case operating points through more aggressive voltage scaling and
tracks changing conditions by monitoring the error recovery rate. Voltage
margins needed in traditional designs to accommodate worst-case performance
conditions are therefore eliminated, resulting in a significant improvement in
energy efficiency. The approach was implemented for a 6mm memory read bus
operating at 1.5GHz (0.13 $\mu$m technology node) and was simulated for a
number of benchmark programs. Even at the worst-case process and environment
conditions, energy gains of up to 17% are achieved, with error recovery rates
under 2.3%. At more typical process and environment conditions, energy gains
range from 35% to 45%, with a performance degradation under 2%. An analysis of
optimum interconnect architectures for maximizing energy gains with this
approach shows that the proposed approach performs well with technology
scaling.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:03:13 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Kaul",
"Himanshu",
""
],
[
"Sylvester",
"Dennis",
""
],
[
"Blaauw",
"David",
""
],
[
"Mudge",
"Trevor",
""
],
[
"Austin",
"Todd",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4680 | EDA Publishing Association | Diana Marculescu | Energy Bounds for Fault-Tolerant Nanoscale Designs | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.CC cs.IT math.IT | null | The problem of determining lower bounds for the energy cost of a given
nanoscale design is addressed via a complexity theory-based approach. This
paper provides a theoretical framework that is able to assess the trade-offs
existing in nanoscale designs between the amount of redundancy needed for a
given level of resilience to errors and the associated energy cost. Circuit
size, logic depth and error resilience are analyzed and brought together in a
theoretical framework that can be seamlessly integrated with automated
synthesis tools and can guide the design process of nanoscale systems comprised
of failure prone devices. The impact of redundancy addition on the switching
energy and its relationship with leakage energy is modeled in detail. Results
show that 99% error resilience is possible for fault-tolerant designs, but at
the expense of at least 40% more energy if individual gates fail independently
with probability of 1%.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:04:27 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Marculescu",
"Diana",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.CC",
"description": "Covers models of computation, complexity classes, structural complexity, complexity tradeoffs, upper and lower bounds. Roughly includes material in ACM Subject Classes F.1 (computation by abstract devices), F.2.3 (tradeoffs among complexity measures), and F.4.3 (formal languages), although some material in formal languages may be more appropriate for Logic in Computer Science. Some material in F.2.1 and F.2.2, may also be appropriate here, but is more likely to have Data Structures and Algorithms as the primary subject area.",
"span": "(Computational Complexity)"
},
{
"class": "Computer Science",
"code": "cs.IT",
"description": "Covers theoretical and experimental aspects of information theory and coding. Includes material in ACM Subject Class E.4 and intersects with H.1.1.",
"span": "(Information Theory)"
},
{
"class": "Mathematics",
"code": "math.IT",
"description": "math.IT is an alias for cs.IT. Covers theoretical and experimental aspects of information theory and coding.",
"span": "(Information Theory)"
}
] |
0710.4681 | EDA Publishing Association | Wolf-Dietrich Weber, Joe Chou, Ian Swarbrick, Drew Wingard | A Quality-of-Service Mechanism for Interconnection Networks in
System-on-Chips | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | As Moore's Law continues to fuel the ability to build ever increasingly
complex system-on-chips (SoCs), achieving performance goals is rising as a
critical challenge to completing designs. In particular, the system
interconnect must efficiently service a diverse set of data flows with widely
ranging quality-of-service (QoS) requirements. However, the known solutions for
off-chip interconnects such as large-scale networks are not necessarily
applicable to the on-chip environment. Latency and memory constraints for
on-chip interconnects are quite different from larger-scale interconnects. This
paper introduces a novel on-chip interconnect arbitration scheme. We show how
this scheme can be distributed across a chip for high-speed implementation. We
compare the performance of the arbitration scheme with other known interconnect
arbitration schemes. Existing schemes typically focus heavily on either low
latency of service for some initiators, or alternatively on guaranteed
bandwidth delivery for other initiators. Our scheme allows service latency on
some initiators to be traded off smoothly against jitter bounds on other
initiators, while still delivering bandwidth guarantees. This scheme is a
subset of the QoS controls that are available in the SonicsMX? (SMX) product.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:05:03 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Weber",
"Wolf-Dietrich",
""
],
[
"Chou",
"Joe",
""
],
[
"Swarbrick",
"Ian",
""
],
[
"Wingard",
"Drew",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4682 | EDA Publishing Association | Ian Oliver | Applying UML and MDA to Real Systems Design | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.SE | null | Traditionally system design has been made from a black box/functionality only
perspective which forces the developer to concentrate on how the functionality
can be decomposed and recomposed into so called components. While this
technique is well established and well known it does suffer fromsome drawbacks;
namely that the systems produced can often be forced into certain, incompatible
architectures, difficult to maintain or reuse and the code itself difficult to
debug. Now that ideas such as the OMG's Model Based Architecture (MDA) or Model
Based Engineering (MBE) and the ubiquitous modelling language UML are being
used (allegedly) and desired we face a number of challenges to existing
techniques.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:07:10 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Oliver",
"Ian",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.SE",
"description": "Covers design tools, software metrics, testing and debugging, programming environments, etc. Roughly includes material in all of ACM Subject Classes D.2, except that D.2.4 (program verification) should probably have Logics in Computer Science as the primary subject area.",
"span": "(Software Engineering)"
}
] |
0710.4683 | EDA Publishing Association | Stephen A. Edwards | The Challenges of Hardware Synthesis from C-Like Languages | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.PL | null | MANY TECHNIQUES for synthesizing digital hardware from C-like languages have
been proposed, but none have emerged as successful as Verilog or VHDL for
register-transfer-level design. This paper looks at two of the fundamental
challenges: concurrency and timing control.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:07:39 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Edwards",
"Stephen A.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.PL",
"description": "Covers programming language semantics, language features, programming approaches (such as object-oriented programming, functional programming, logic programming). Also includes material on compilers oriented towards programming languages; other material on compilers may be more appropriate in Architecture (AR). Roughly includes material in ACM Subject Classes D.1 and D.3.",
"span": "(Programming Languages)"
}
] |
0710.4684 | EDA Publishing Association | S. Tosun, N. Mansouri, E. Arvas, M. Kandemir, Yuan Xie | Reliability-Centric High-Level Synthesis | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Importance of addressing soft errors in both safety critical applications and
commercial consumer products is increasing, mainly due to ever shrinking
geometries, higher-density circuits, and employment of power-saving techniques
such as voltage scaling and component shut-down. As a result, it is becoming
necessary to treat reliability as a first-class citizen in system design. In
particular, reliability decisions taken early in system design can have
significant benefits in terms of design quality. Motivated by this observation,
this paper presents a reliability-centric high-level synthesis approach that
addresses the soft error problem. The proposed approach tries to maximize
reliability of the design while observing the bounds on area and performance,
and makes use of our reliability characterization of hardware components such
as adders and multipliers. We implemented the proposed approach, performed
experiments with several designs, and compared the results with those obtained
by a prior proposal.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:07:44 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Tosun",
"S.",
""
],
[
"Mansouri",
"N.",
""
],
[
"Arvas",
"E.",
""
],
[
"Kandemir",
"M.",
""
],
[
"Xie",
"Yuan",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4685 | EDA Publishing Association | C. Bolchini, F. Salice, D. Sciuto, L. Pomante | Reliable System Specification for Self-Checking Data-Paths | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | The design of reliable circuits has received a lot of attention in the past,
leading to the definition of several design techniques introducing fault
detection and fault tolerance properties in systems for critical
applications/environments. Such design methodologies tackled the problem at
different abstraction levels, from switch-level to logic, RT level, and more
recently to system level. Aim of this paper is to introduce a novel
system-level technique based on the redefinition of the operators functionality
in the system specification. This technique provides reliability properties to
the system data path, transparently with respect to the designer. Feasibility,
fault coverage, performance degradation and overheads are investigated on a FIR
circuit.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:08:39 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Bolchini",
"C.",
""
],
[
"Salice",
"F.",
""
],
[
"Sciuto",
"D.",
""
],
[
"Pomante",
"L.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4686 | EDA Publishing Association | Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty | Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Many SOCs today contain both digital and analog embedded cores. Even though
the test cost for such mixed-signal SOCs is significantly higher than that for
digital SOCs, most prior research in this area has focused exclusively on
digital cores. We propose a low-cost test development methodology for
mixed-signal SOCs that allows the analog and digital cores to be tested in a
unified manner, thereby minimizing the overall test cost. The analog cores in
the SOC are wrapped such that they can be accessed using a digital test access
mechanism (TAM). We evaluate the impact of the use of analog test wrappers on
area overhead and test time. To reduce area overhead, we present an analog test
wrapper optimization technique, which is then combined with TAM optimization in
a cost-oriented heuristic approach for test scheduling. We also demonstrate the
feasibility of using analog wrappers by presenting transistor-level simulations
for an analog wrapper and a representative core. We present experimental
results on test scheduling for an ITC'02 benchmark SOC that has been augmented
with five analog cores.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:08:40 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Sehgal",
"Anuja",
""
],
[
"Liu",
"Fang",
""
],
[
"Ozev",
"Sule",
""
],
[
"Chakrabarty",
"Krishnendu",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4687 | EDA Publishing Association | Sandeep Kumar Goel, Erik Jan Marinissen | On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of
System Chips | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Multi-site testing is a popular and effective way to increase test throughput
and reduce test costs. We present a test throughput model, in which we focus on
wafer testing, and consider parameters like test time, index time,
abort-on-fail, and contact yield. Conventional multi-site testing requires
sufficient ATE resources, such as ATE channels, to allow to test multiple SOCs
in parallel. In this paper, we design and optimize on-chip DfT, in order to
maximize the test throughput for a given SOC and ATE. The on-chip DfT consists
of an E-RPCT wrapper, and, for modular SOCs, module wrappers and TAMs. We
present experimental results for a Philips SOC and several ITC'02 SOC Test
Benchmarks.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:09:14 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Goel",
"Sandeep Kumar",
""
],
[
"Marinissen",
"Erik Jan",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4688 | EDA Publishing Association | F. Lima Kastensmidt, L. Sterpone, L. Carro, M. Sonza Reorda | On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based
FPGAs | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Triple Modular Redundancy (TMR) is a suitable fault tolerant technique for
SRAM-based FPGA. However, one of the main challenges in achieving 100%
robustness in designs protected by TMR running on programmable platforms is to
prevent upsets in the routing from provoking undesirable connections between
signals from distinct redundant logic parts, which can generate an error in the
output. This paper investigates the optimal design of the TMR logic (e.g., by
cleverly inserting voters) to ensure robustness. Four different versions of a
TMR digital filter were analyzed by fault injection. Faults were randomly
inserted straight into the bitstream of the FPGA. The experimental results
presented in this paper demonstrate that the number and placement of voters in
the TMR design can directly affect the fault tolerance, ranging from 4.03% to
0.98% the number of upsets in the routing able to cause an error in the TMR
circuit.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:09:34 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Kastensmidt",
"F. Lima",
""
],
[
"Sterpone",
"L.",
""
],
[
"Carro",
"L.",
""
],
[
"Reorda",
"M. Sonza",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4689 | EDA Publishing Association | K. C. Shashidhar, Maurice Bruynooghe, Francky Catthoor, Gerda Janssens | Functional Equivalence Checking for Verification of Algebraic
Transformations on Array-Intensive Source Code | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.LO | null | Development of energy and performance-efficient embedded software is
increasingly relying on application of complex transformations on the critical
parts of the source code. Designers applying such nontrivial source code
transformations are often faced with the problem of ensuring functional
equivalence of the original and transformed programs. Currently they have to
rely on incomplete and time-consuming simulation. Formal automatic verification
of the transformed program against the original is instead desirable. This
calls for equivalence checking tools similar to the ones available for
comparing digital circuits. We present such a tool to compare array-intensive
programs related through a combination of important global transformations like
expression propagations, loop and algebraic transformations. When the
transformed program fails to pass the equivalence check, the tool provides
specific feedback on the possible locations of errors.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:09:59 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Shashidhar",
"K. C.",
""
],
[
"Bruynooghe",
"Maurice",
""
],
[
"Catthoor",
"Francky",
""
],
[
"Janssens",
"Gerda",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.LO",
"description": "Covers all aspects of logic in computer science, including finite model theory, logics of programs, modal logic, and program verification. Programming language semantics should have Programming Languages as the primary subject area. Roughly includes material in ACM Subject Classes D.2.4, F.3.1, F.4.0, F.4.1, and F.4.2; some material in F.4.3 (formal languages) may also be appropriate here, although Computational Complexity is typically the more appropriate subject area.",
"span": "(Logic in Computer Science)"
}
] |
0710.4690 | EDA Publishing Association | Xun Liu, Yuantao Peng, Marios C. Papaefthymiou | RIP: An Efficient Hybrid Repeater Insertion Scheme for Low Power | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | This paper presents a novel repeater insertion algorithm for interconnect
power minimization. The novelty of our approach is in the judicious integration
of an analytical solver and a dynamic programming based method. Specifically,
the analytical solver chooses a concise repeater library and a small set of
repeater location candidates such that the dynamic programming algorithm can be
performed fast with little degradation of the solution quality. In comparison
with previously reported repeater insertion schemes, within comparable
runtimes, our approach achieves up to 37% higher power savings. Moreover, for
the same design quality, our scheme attains a speedup of two orders of
magnitude.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:10:38 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Liu",
"Xun",
""
],
[
"Peng",
"Yuantao",
""
],
[
"Papaefthymiou",
"Marios C.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4691 | EDA Publishing Association | Zhuo Li, Weiping Shi | An O(bn^2) Time Algorithm for Optimal Buffer Insertion with b Buffer
Types | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Buffer insertion is a popular technique to reduce the interconnect delay. The
classic buffer insertion algorithm of van Ginneken has time complexity O(n^2),
where n is the number of buffer positions. Lillis, Cheng and Lin extended van
Ginneken's algorithm to allow b buffer types in time O (b^2 n^2). For modern
design libraries that contain hundreds of buffers, it is a serious challenge to
balance the speed and performance of the buffer insertion algorithm. In this
paper, we present a new algorithm that computes the optimal buffer insertion in
O (bn^2) time. The reduction is achieved by the observation that the (Q, C)
pairs of the candidates that generate the new candidates must form a convex
hull. On industrial test cases, the new algorithm is faster than the previous
best buffer insertion algorithms by orders of magnitude.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:11:11 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Li",
"Zhuo",
""
],
[
"Shi",
"Weiping",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4692 | EDA Publishing Association | K.-U. Kirstein, Y. Li, M. Zimmermann, C. Vancura, T. Volden, W. H.
Song, J. Lichtenberg, A. Hierlemannn | Cantilever-Based Biosensors in CMOS Technology | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Single-chip CMOS-based biosensors that feature microcantilevers as transducer
elements are presented. The cantilevers are functionalized for the capturing of
specific analytes, e.g., proteins or DNA. The binding of the analyte changes
the mechanical properties of the cantilevers such as surface stress and
resonant frequency, which can be detected by an integrated Wheatstone bridge.
The monolithic integrated readout allows for a high signal-to-noise ratio,
lowers the sensitivity to external interference and enables autonomous device
operation.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:11:49 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Kirstein",
"K. -U.",
""
],
[
"Li",
"Y.",
""
],
[
"Zimmermann",
"M.",
""
],
[
"Vancura",
"C.",
""
],
[
"Volden",
"T.",
""
],
[
"Song",
"W. H.",
""
],
[
"Lichtenberg",
"J.",
""
],
[
"Hierlemannn",
"A.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4693 | EDA Publishing Association | Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg,
Stefan Eichenberger, Fred Bowen | Memory Testing Under Different Stress Conditions: An Industrial
Evaluation | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper presents the effectiveness of various stress conditions (mainly
voltage and frequency) on detecting the resistive shorts and open defects in
deep sub-micron embedded memories in an industrial environment. Simulation
studies on very-low voltage, high voltage and at-speed testing show the need of
the stress conditions for high quality products; i.e., low defect-per-million
(DPM) level, which is driving the semiconductor market today. The above test
conditions have been validated to screen out bad devices on real silicon (a
test-chip) built on CMOS 0.18 um technology. IFA (inductive fault analysis)
based simulation technique leads to an efficient fault coverage and DPM
estimator, which helps the customers upfront to make decisions on test
algorithm implementations under different stress conditions in order to reduce
the number of test escapes.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:14:05 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Majhi",
"Ananta K.",
""
],
[
"Azimane",
"Mohamed",
""
],
[
"Gronthoud",
"Guido",
""
],
[
"Lousberg",
"Maurice",
""
],
[
"Eichenberger",
"Stefan",
""
],
[
"Bowen",
"Fred",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4694 | EDA Publishing Association | Guowu Yang, William N. N. Hung, Xiaoyu Song, Marek Perkowski | Exact Synthesis of 3-Qubit Quantum Circuits from Non-Binary Quantum
Gates Using Multiple-Valued Logic and Group Theory | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.LO | null | We propose an approach to optimally synthesize quantum circuits from
non-permutative quantum gates such as Controlled-Square-Root-of-Not (i.e.
Controlled-V). Our approach reduces the synthesis problem to multiple-valued
optimization and uses group theory. We devise a novel technique that transforms
the quantum logic synthesis problem from a multi-valued constrained
optimization problem to a group permutation problem. The transformation enables
us to utilize group theory to exploit the properties of the synthesis problem.
Assuming a cost of one for each two-qubit gate, we found all reversible
circuits with quantum costs of 4, 5, 6, etc, and give another algorithm to
realize these reversible circuits with quantum gates.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:14:41 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Yang",
"Guowu",
""
],
[
"Hung",
"William N. N.",
""
],
[
"Song",
"Xiaoyu",
""
],
[
"Perkowski",
"Marek",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.LO",
"description": "Covers all aspects of logic in computer science, including finite model theory, logics of programs, modal logic, and program verification. Programming language semantics should have Programming Languages as the primary subject area. Roughly includes material in ACM Subject Classes D.2.4, F.3.1, F.4.0, F.4.1, and F.4.2; some material in F.4.3 (formal languages) may also be appropriate here, although Computational Complexity is typically the more appropriate subject area.",
"span": "(Logic in Computer Science)"
}
] |
0710.4695 | EDA Publishing Association | Alan Mishchenko, Robert K. Brayton | SAT-Based Complete Don't-Care Computation for Network Optimization | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.LO | null | This paper describes an improved approach to Boolean network optimization
using internal don't-cares. The improvements concern the type of don't-cares
computed, their scope, and the computation method. Instead of the traditionally
used compatible observability don't-cares (CODCs), we introduce and justify the
use of complete don't-cares (CDC). To ensure the robustness of the don't-care
computation for very large industrial networks, a optional windowing scheme is
implemented that computes substantial subsets of the CDCs in reasonable time.
Finally, we give a SAT-based don't-care computation algorithm that is more
efficient than BDD-based algorithms. Experimental results confirm that these
improvements work well in practice. Complete don't-cares allow for a reduction
in the number of literals compared to the CODCs. Windowing guarantees
robustness, even for very large benchmarks on which previous methods could not
be applied. SAT reduces the runtime and enhances robustness, making don't-cares
affordable for a variety of other Boolean methods applied to the network.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:15:10 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Mishchenko",
"Alan",
""
],
[
"Brayton",
"Robert K.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.LO",
"description": "Covers all aspects of logic in computer science, including finite model theory, logics of programs, modal logic, and program verification. Programming language semantics should have Programming Languages as the primary subject area. Roughly includes material in ACM Subject Classes D.2.4, F.3.1, F.4.0, F.4.1, and F.4.2; some material in F.4.3 (formal languages) may also be appropriate here, although Computational Complexity is typically the more appropriate subject area.",
"span": "(Logic in Computer Science)"
}
] |
0710.4697 | EDA Publishing Association | Aseem Agarwal, Kaviraj Chopra, David Blaauw | Statistical Timing Based Optimization using Gate Sizing | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | The increased dominance of intra-die process variations has motivated the
field of Statistical Static Timing Analysis (SSTA) and has raised the need for
SSTA-based circuit optimization. In this paper, we propose a new sensitivity
based, statistical gate sizing method. Since brute-force computation of the
change in circuit delay distribution to gate size change is computationally
expensive, we propose an efficient and exact pruning algorithm. The pruning
algorithm is based on a novel theory of perturbation bounds which are shown to
decrease as they propagate through the circuit. This allows pruning of gate
sensitivities without complete propagation of their perturbations. We apply our
proposed optimization algorithm to ISCAS benchmark circuits and demonstrate the
accuracy and efficiency of the proposed method. Our results show an improvement
of up to 10.5% in the 99-percentile circuit delay for the same circuit area,
using the proposed statistical optimizer and a run time improvement of up to
56x compared to the brute-force approach.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:16:49 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Agarwal",
"Aseem",
""
],
[
"Chopra",
"Kaviraj",
""
],
[
"Blaauw",
"David",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4698 | EDA Publishing Association | Ambar A. Gadkari, S. Ramesh | Automated Synthesis of Assertion Monitors using Visual Specifications | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.LO | null | Automated synthesis of monitors from high-level properties plays a
significant role in assertion-based verification. We present here a methodology
to synthesize assertion monitors from visual specifications given in CESC
(Clocked Event Sequence Chart). CESC is a visual language designed for
specifying system level interactions involving single and multiple clock
domains. It has well-defined graphical and textual syntax and formal semantics
based on synchronous language paradigm enabling formal analysis of
specifications. In this paper we provide an overview of CESC language with few
illustrative examples. The algorithm for automated synthesis of assertion
monitors from CESC specifications is described. A few examples from standard
bus protocols (OCP-IP and AMBA) are presented to demonstrate the application of
monitor synthesis algorithm.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:18:46 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Gadkari",
"Ambar A.",
""
],
[
"Ramesh",
"S.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.LO",
"description": "Covers all aspects of logic in computer science, including finite model theory, logics of programs, modal logic, and program verification. Programming language semantics should have Programming Languages as the primary subject area. Roughly includes material in ACM Subject Classes D.2.4, F.3.1, F.4.0, F.4.1, and F.4.2; some material in F.4.3 (formal languages) may also be appropriate here, although Computational Complexity is typically the more appropriate subject area.",
"span": "(Logic in Computer Science)"
}
] |
0710.4700 | EDA Publishing Association | Greg Stitt, Frank Vahid | A Decompilation Approach to Partitioning Software for
Microprocessor/FPGA Platforms | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.SE | null | In this paper, we present a software compilation approach for
microprocessor/FPGA platforms that partitions a software binary onto custom
hardware implemented in the FPGA. Our approach imposes less restrictions on
software tool flow than previous compiler approaches, allowing software
designers to use any software language and compiler. Our approach uses a
back-end partitioning tool that utilizes decompilation techniques to recover
important high-level information, resulting in performance comparable to
high-level compiler-based approaches.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:22:50 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Stitt",
"Greg",
""
],
[
"Vahid",
"Frank",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.SE",
"description": "Covers design tools, software metrics, testing and debugging, programming environments, etc. Roughly includes material in all of ACM Subject Classes D.2, except that D.2.4 (program verification) should probably have Logics in Computer Science as the primary subject area.",
"span": "(Software Engineering)"
}
] |
0710.4701 | EDA Publishing Association | Jae-Gon Lee, Moo-Kyoung Chung, Ki-Yong Ahn, Sang-Heon Lee, Chong-Min
Kyung | A Prediction Packetizing Scheme for Reducing Channel Traffic in
Transaction-Level Hardware/Software Co-Emulation | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.PF | null | This paper presents a scheme for efficient channel usage between simulator
and accelerator where the accelerator models some RTL sub-blocks in the
accelerator-based hardware/software co-simulation while the simulator runs
transaction-level model of the remaining part of the whole chip being verified.
With conventional simulation accelerator, evaluations of simulator and
accelerator alternate at every valid simulation time, which results in poor
simulation performance due to startup overhead of simulator-accelerator channel
access. The startup overhead can be reduced by merging multiple transactions on
the channel into a single burst traffic. We propose a predictive packetizing
scheme for reducing channel traffic by merging as many transactions into a
burst traffic as possible based on 'prediction and rollback.' Under ideal
condition with 100% prediction accuracy, the proposed method shows a
performance gain of 1500% compared to the conventional one.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:27:03 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Lee",
"Jae-Gon",
""
],
[
"Chung",
"Moo-Kyoung",
""
],
[
"Ahn",
"Ki-Yong",
""
],
[
"Lee",
"Sang-Heon",
""
],
[
"Kyung",
"Chong-Min",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.PF",
"description": "Covers performance measurement and evaluation, queueing, and simulation. Roughly includes material in ACM Subject Classes D.4.8 and K.6.2.",
"span": "(Performance)"
}
] |
0710.4702 | EDA Publishing Association | Nastaran Baradaran, Pedro C. Diniz | A Register Allocation Algorithm in the Presence of Scalar Replacement
for Fine-Grain Configurable Architectures | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.PL | null | The aggressive application of scalar replacement to array references
substantially reduces the number of memory operations at the expense of a
possibly very large number of registers. In this paper we describe a register
allocation algorithm that assigns registers to scalar replaced array references
along the critical paths of a computation, in many cases exploiting the
opportunity for concurrent memory accesses. Experimental results, for a set of
image/signal processing code kernels, reveal that the proposed algorithm leads
to a substantial reduction of the number of execution cycles for the
corresponding hardware implementation on a contemporary
Field-Programmable-Gate-Array (FPGA) when compared to other greedy allocation
algorithms, in some cases, using even fewer number of registers.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:27:20 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Baradaran",
"Nastaran",
""
],
[
"Diniz",
"Pedro C.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.PL",
"description": "Covers programming language semantics, language features, programming approaches (such as object-oriented programming, functional programming, logic programming). Also includes material on compilers oriented towards programming languages; other material on compilers may be more appropriate in Architecture (AR). Roughly includes material in ACM Subject Classes D.1 and D.3.",
"span": "(Programming Languages)"
}
] |
0710.4703 | EDA Publishing Association | Tohru Ishihara, Farzan Fallah | A Way Memoization Technique for Reducing Power Consumption of Caches in
Application Specific Integrated Processors | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper presents a technique for eliminating redundant cache-tag and
cache-way accesses to reduce power consumption. The basic idea is to keep a
small number of Most Recently Used (MRU) addresses in a Memory Address Buffer
(MAB) and to omit redundant tag and way accesses when there is a MAB-hit. Since
the approach keeps only tag and set-index values in the MAB, the energy and
area overheads are relatively small even for a MAB with a large number of
entries. Furthermore, the approach does not sacrifice the performance. In other
words, neither the cycle time nor the number of executed cycles increases. The
proposed technique has been applied to Fujitsu VLIW processor (FR-V) and its
power saving has been estimated using NanoSim. Experiments for 32kB 2-way set
associative caches show the power consumption of I-cache and D-cache can be
reduced by 40% and 50%, respectively.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:27:22 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Ishihara",
"Tohru",
""
],
[
"Fallah",
"Farzan",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4704 | EDA Publishing Association | Yoonjin Kim, Mary Kiemb, Chulsoo Park, Jinyong Jung, Kiyoung Choi | Resource Sharing and Pipelining in Coarse-Grained Reconfigurable
Architecture for Domain-Specific Optimization | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Coarse-grained reconfigurable architectures aim to achieve both goals of high
performance and flexibility. However, existing reconfigurable array
architectures require many resources without considering the specific
application domain. Functional resources that take long latency and/or large
area can be pipelined and/or shared among the processing elements. Therefore
the hardware cost and the delay can be effectively reduced without any
performance degradation for some application domains. We suggest such
reconfigurable array architecture template and design space exploration flow
for domain-specific optimization. Experimental results show that our approach
is much more efficient both in performance and area compared to existing
reconfigurable architectures.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:28:05 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Kim",
"Yoonjin",
""
],
[
"Kiemb",
"Mary",
""
],
[
"Park",
"Chulsoo",
""
],
[
"Jung",
"Jinyong",
""
],
[
"Choi",
"Kiyoung",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4705 | EDA Publishing Association | Roman Lysecky, Frank Vahid | A Study of the Speedups and Competitiveness of FPGA Soft Processor Cores
using Dynamic Hardware/Software Partitioning | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Field programmable gate arrays (FPGAs) provide designers with the ability to
quickly create hardware circuits. Increases in FPGA configurable logic capacity
and decreasing FPGA costs have enabled designers to more readily incorporate
FPGAs in their designs. FPGA vendors have begun providing configurable soft
processor cores that can be synthesized onto their FPGA products. While FPGAs
with soft processor cores provide designers with increased flexibility, such
processors typically have degraded performance and energy consumption compared
to hard-core processors. Previously, we proposed warp processing, a technique
capable of optimizing a software application by dynamically and transparently
re-implementing critical software kernels as custom circuits in on-chip
configurable logic. In this paper, we study the potential of a MicroBlaze
soft-core based warp processing system to eliminate the performance and energy
overhead of a soft-core processor compared to a hard-core processor. We
demonstrate that the soft-core based warp processor achieves average speedups
of 5.8 and energy reductions of 57% compared to the soft core alone. Our data
shows that a soft-core based warp processor yields performance and energy
consumption competitive with existing hard-core processors, thus expanding the
usefulness of soft processor cores on FPGAs to a broader range of applications.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:29:03 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Lysecky",
"Roman",
""
],
[
"Vahid",
"Frank",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4706 | EDA Publishing Association | Rui Rodrigues, Joao M. P. Cardoso | An Infrastructure to Functionally Test Designs Generated by Compilers
Targeting FPGAs | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper presents an infrastructure to test the functionality of the
specific architectures output by a high-level compiler targeting dynamically
reconfigurable hardware. It results in a suitable scheme to verify the
architectures generated by the compiler, each time new optimization techniques
are included or changes in the compiler are performed. We believe this kind of
infrastructure is important to verify, by functional simulation, further
research techniques, as far as compilation to Field-Programmable Gate Array
(FPGA) platforms is concerned.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:29:33 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Rodrigues",
"Rui",
""
],
[
"Cardoso",
"Joao M. P.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4707 | EDA Publishing Association | Umit Y. Ogras, Radu Marculescu | Energy- and Performance-Driven NoC Communication Architecture Synthesis
Using a Decomposition Approach | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | In this paper, we present a methodology for customized communication
architecture synthesis that matches the communication requirements of the
target application. This is an important problem, particularly for
network-based implementations of complex applications. Our approach is based on
using frequently encountered generic communication primitives as an alphabet
capable of characterizing any given communication pattern. The proposed
algorithm searches through the entire design space for a solution that
minimizes the system total energy consumption, while satisfying the other
design constraints. Compared to the standard mesh architecture, the customized
architecture generated by the newly proposed approach shows about 36%
throughput increase and 51% reduction in the energy required to encrypt 128
bits of data with a standard encryption algorithm.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:29:58 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Ogras",
"Umit Y.",
""
],
[
"Marculescu",
"Radu",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4709 | EDA Publishing Association | Georges Gielen, Wim Dehaene, Phillip Christie, Dieter Draxelmayr,
Edmond Janssens, Karen Maex, Ted Vucurevich | Analog and Digital Circuit Design in 65 nm CMOS: End of the Road? | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This special session adresses the problems that designers face when
implementing analog and digital circuits in nanometer technologies. An
introductory embedded tutorial will give an overview of the design problems at
hand : the leakage power and process variability and their implications for
digital circuits and memories, and the reducing supply voltages, the design
productivity and signal integrity problems for embedded analog blocks. Next, a
panel of experts from both industrial semiconductor houses and design
companies, EDA vendors and research institutes will present and discuss with
the audience their opinions on whether the design road ends at marker "65nm" or
not.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:30:46 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Gielen",
"Georges",
""
],
[
"Dehaene",
"Wim",
""
],
[
"Christie",
"Phillip",
""
],
[
"Draxelmayr",
"Dieter",
""
],
[
"Janssens",
"Edmond",
""
],
[
"Maex",
"Karen",
""
],
[
"Vucurevich",
"Ted",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4710 | EDA Publishing Association | Ali Iranli, Hanif Fatemi, Massoud Pedram | HEBS: Histogram Equalization for Backlight Scaling | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | In this paper, a method is proposed for finding a pixel transformation
function that maximizes backlight dimming while maintaining a pre-specified
image distortion level for a liquid crystal display. This is achieved by
finding a pixel transformation function, which maps the original image
histogram to a new histogram with lower dynamic range. Next the contrast of the
transformed image is enhanced so as to compensate for brightness loss that
would arise from backlight dimming. The proposed approach relies on an accurate
definition of the image distortion which takes into account both the pixel
value differences and a model of the human visual system and is amenable to
highly efficient hardware realization. Experimental results show that the
histogram equalization for backlight scaling method results in about 45% power
saving with an effective distortion rate of 5% and 65% power saving for a 20%
distortion rate. This is significantly higher power savings compared to
previously reported backlight dimming approaches.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:31:41 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Iranli",
"Ali",
""
],
[
"Fatemi",
"Hanif",
""
],
[
"Pedram",
"Massoud",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4711 | EDA Publishing Association | N. Huot (TIMA), H. Dubreuil (TIMA), L. Fesquet (TIMA), M. Renaudin
(TIMA) | FPGA Architecture for Multi-Style Asynchronous Logic | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper presents a novel FPGA architecture for implementing various styles
of asynchronous logic. The main objective is to break the dependency between
the FPGA architecture dedicated to asynchronous logic and the logic style. The
innovative aspects of the architecture are described. Moreover the structure is
well suited to be rebuilt and adapted to fit with further asynchronous logic
evolutions thanks to the architecture genericity. A full-adder was implemented
in different styles of logic to show the architecture flexibility.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:32:43 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Huot",
"N.",
"",
"TIMA"
],
[
"Dubreuil",
"H.",
"",
"TIMA"
],
[
"Fesquet",
"L.",
"",
"TIMA"
],
[
"Renaudin",
"M.",
"",
"TIMA"
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4712 | EDA Publishing Association | Ghazanfar Asadi, Mehdi B. Tahoori | An Accurate SER Estimation Method Based on Propagation Probability | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | In this paper, we present an accurate but very fast soft error rate (SER)
estimation technique for digital circuits based on error propagation
probability (EPP) computation. Experiments results and comparison of the
results with the random simulation technique show that our proposed method is
on average within 6% of the random simulation method and four to five orders of
magnitude faster.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:33:14 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Asadi",
"Ghazanfar",
""
],
[
"Tahoori",
"Mehdi B.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4713 | EDA Publishing Association | Osama Neiroukh, Xiaoyu Song | Improving the Process-Variation Tolerance of Digital Circuits Using Gate
Sizing and Statistical Techniques | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | A new approach for enhancing the process-variation tolerance of digital
circuits is described. We extend recent advances in statistical timing analysis
into an optimization framework. Our objective is to reduce the performance
variance of a technology-mapped circuit where delays across elements are
represented by random variables which capture the manufacturing variations. We
introduce the notion of statistical critical paths, which account for both
means and variances of performance variation. An optimization engine is used to
size gates with a goal of reducing the timing variance along the statistical
critical paths. We apply a pair of nested statistical analysis methods
deploying a slower more accurate approach for tracking statistical critical
paths and a fast engine for evaluation of gate size assignments. We derive a
new approximation for the max operation on random variables which is deployed
for the faster inner engine. Circuit optimization is carried out using a
gain-based algorithm that terminates when constraints are satisfied or no
further improvements can be made. We show optimization results that demonstrate
an average of 72% reduction in performance variation at the expense of average
20% increase in design area.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:33:36 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Neiroukh",
"Osama",
""
],
[
"Song",
"Xiaoyu",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4714 | EDA Publishing Association | Jia Yu, Wei Wu, Xi Chen, Harry Hsieh, Jun Yang, Felice Balarin | Assertion-Based Design Exploration of DVS in Network Processor
Architectures | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | With the scaling of technology and higher requirements on performance and
functionality, power dissipation is becoming one of the major design
considerations in the development of network processors. In this paper, we use
an assertion-based methodology for system-level power/performance analysis to
study two dynamic voltage scaling (DVS) techniques, traffic-based DVS and
execution-based DVS, in a network processor model. Using the automatically
generated distribution analyzers, we analyze the power and performance
distributions and study their trade-offs for the two DVS policies with
different parameter settings such as threshold values and window sizes. We
discuss the optimal configurations of the two DVS policies under different
design requirements. By a set of experiments, we show that the assertion-based
trace analysis methodology is an efficient tool that can help a designer easily
compare and study optimal architectural configurations in a large design space.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:33:38 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Yu",
"Jia",
""
],
[
"Wu",
"Wei",
""
],
[
"Chen",
"Xi",
""
],
[
"Hsieh",
"Harry",
""
],
[
"Yang",
"Jun",
""
],
[
"Balarin",
"Felice",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4715 | EDA Publishing Association | Jonathan R. Carter, Sule Ozev, Daniel J. Sorin | Circuit-Level Modeling for Concurrent Testing of Operational Defects due
to Gate Oxide Breakdown | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | As device sizes shrink and current densities increase, the probability of
device failures due to gate oxide breakdown (OBD) also increases. To provide
designs that are tolerant to such failures, we must investigate and understand
the manifestations of this physical phenomenon at the circuit and system level.
In this paper, we develop a model for operational OBD defects, and we explore
how to test for faults due to OBD. For a NAND gate, we derive the necessary
input conditions that excite and detect errors due to OBD defects at the gate
level. We show that traditional pattern generators fail to exercise all of
these defects. Finally, we show that these test patterns can be propagated and
justified for a combinational circuit in a manner similar to traditional ATPG.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:34:11 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Carter",
"Jonathan R.",
""
],
[
"Ozev",
"Sule",
""
],
[
"Sorin",
"Daniel J.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4716 | EDA Publishing Association | Zhi Guo, Betul Buyukkurt, Walid Najjar, Kees Vissers | Optimized Generation of Data-Path from C Codes for FPGAs | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | FPGAs, as computing devices, offer significant speedup over microprocessors.
Furthermore, their configurability offers an advantage over traditional ASICs.
However, they do not yet enjoy high-level language programmability, as
microprocessors do. This has become the main obstacle for their wider
acceptance by application designers. ROCCC is a compiler designed to generate
circuits from C source code to execute on FPGAs, more specifically on CSoCs. It
generates RTL level HDLs from frequently executing kernels in an application.
In this paper, we describe ROCCC's system overview and focus on its data path
generation. We compare the performance of ROCCC-generated VHDL code with that
of Xilinx IPs. The synthesis result shows that ROCCC-generated circuit takes
around 2x ~ 3x area and runs at comparable clock rate.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:34:19 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Guo",
"Zhi",
""
],
[
"Buyukkurt",
"Betul",
""
],
[
"Najjar",
"Walid",
""
],
[
"Vissers",
"Kees",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4717 | EDA Publishing Association | Raoul F. Badaoui, Ranga Vemuri | Multi-Placement Structures for Fast and Optimized Placement in Analog
Circuit Synthesis | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper presents the novel idea of multi-placement structures, for a fast
and optimized placement instantiation in analog circuit synthesis. These
structures need to be generated only once for a specific circuit topology. When
used in synthesis, these pre-generated structures instantiate various layout
floorplans for various sizes and parameters of a circuit. Unlike procedural
layout generators, they enable fast placement of circuits while keeping the
quality of the placements at a high level during a synthesis process. The fast
placement is a result of high speed instantiation resulting from the efficiency
of the multi-placement structure. The good quality of placements derive from
the extensive and intelligent search process that is used to build the
multi-placement structure. The target benchmarks of these structures are analog
circuits in the vicinity of 25 modules. An algorithm for the generation of such
multi-placement structures is presented. Experimental results show placement
execution times with an average of a few milliseconds making them usable during
layout-aware synthesis for optimized placements.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:35:03 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Badaoui",
"Raoul F.",
""
],
[
"Vemuri",
"Ranga",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4718 | EDA Publishing Association | Marcelo Negreiros, Luigi Carro, Altamiro A. Susin | Noise Figure Evaluation Using Low Cost BIST | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | A technique for evaluating noise figure suitable for BIST implementation is
described. It is based on a low cost single-bit digitizer, which allows the
simultaneous evaluation of noise figure in several test points of the analog
circuit. The method is also able to benefit from SoC resources, like memory and
processing power. Theoretical background and experimental results are presented
in order to demonstrate the feasibility of the approach.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:35:44 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Negreiros",
"Marcelo",
""
],
[
"Carro",
"Luigi",
""
],
[
"Susin",
"Altamiro A.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4719 | EDA Publishing Association | Sounil Biswas, Peng Li, R. D. (shawn) Blanton, Larry T. Pileggi | Specification Test Compaction for Analog Circuits and MEMS | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Testing a non-digital integrated system against all of its specifications can
be quite expensive due to the elaborate test application and measurement setup
required. We propose to eliminate redundant tests by employing e-SVM based
statistical learning. Application of the proposed methodology to an operational
amplifier and a MEMS accelerometer reveal that redundant tests can be
statistically identified from a complete set of specification-based tests with
negligible error. Specifically, after eliminating five of eleven
specification-based tests for an operational amplifier, the defect escape and
yield loss is small at 0.6% and 0.9%, respectively. For the accelerometer,
defect escape of 0.2% and yield loss of 0.1% occurs when the hot and colt tests
are eliminated. For the accelerometer, this level of Compaction would reduce
test cost by more than half.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:36:21 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Biswas",
"Sounil",
"",
"shawn"
],
[
"Li",
"Peng",
"",
"shawn"
],
[
"D.",
"R.",
"",
"shawn"
],
[
"Blanton",
"",
""
],
[
"Pileggi",
"Larry T.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4720 | EDA Publishing Association | Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee | Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Nanometer circuits are becoming increasingly susceptible to soft-errors due
to alpha-particle and atmospheric neutron strikes as device scaling reduces
node capacitances and supply/threshold voltage scaling reduces noise margins.
It is becoming crucial to add soft-error tolerance estimation and optimization
to the design flow to handle the increasing susceptibility. The first part of
this paper presents a tool for accurate soft-error tolerance analysis of
nanometer circuits (ASERTA) that can be used to estimate the soft-error
tolerance of nanometer circuits consisting of millions of gates. The tolerance
estimates generated by the tool match SPICE generated estimates closely while
taking orders of magnitude less computation time. The second part of the paper
presents a tool for soft-error tolerance optimization of nanometer circuits
(SERTOPT) using the tolerance estimates generated by ASERTA. The tool finds
optimal sizes, channel lengths, supply voltages and threshold voltages to be
assigned to gates in a combinational circuit such that the soft-error tolerance
is increased while meeting the timing constraint. Experiments on ISCAS'85
benchmark circuits showed that soft-error rate of the optimized circuit
decreased by as much as 47% with marginal increase in circuit delay.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:36:27 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Dhillon",
"Yuvraj Singh",
""
],
[
"Diril",
"Abdulkadir Utku",
""
],
[
"Chatterjee",
"Abhijit",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4721 | EDA Publishing Association | Pekka Syri, Juha Hakkinen, Markku Moilanen | IEEE 1149.4 Compatible ABMs for Basic RF Measurements | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | An analogue testing standard IEEE 1149.4 is mainly targeted for low-frequency
testing. The problem studied in this paper is extending the standard also for
radio frequency testing. IEEE 1149.4 compatible measurement structures (ABMs)
developed in this study extract the information one is measuring from the radio
frequency signal and represent the result as a DC voltage level. The ABMs
presented in this paper are targeted for power and frequency measurements
operating in frequencies from 1 GHz to 2 GHz. The power measurement error
caused by temperature, supply voltage and process variations is roughly 2 dB
and the frequency measurement error is 0.1 GHz, respectively.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:36:53 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Syri",
"Pekka",
""
],
[
"Hakkinen",
"Juha",
""
],
[
"Moilanen",
"Markku",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4722 | EDA Publishing Association | Yu-Tsun Chien, Dong Chen, Jea-Hong Lou, Gin-Kou Ma, Rob A. Rutenbar,
Tamal Mukherjee | Designer-Driven Topology Optimization for Pipelined Analog to Digital
Converters | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper suggests a practical "hybrid" synthesis methodology which
integrates designer-derived analytical models for system-level description with
simulation-based models at the circuit level. We show how to optimize
stage-resolution to minimize the power in a pipelined ADC. Exploration (via
detailed synthesis) of several ADC configurations is used to show that a
4-3-2... resolution distribution uses the least power for a 13-bit 40 MSPS
converter in a 0.25 $\mu$m CMOS process.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:36:56 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Chien",
"Yu-Tsun",
""
],
[
"Chen",
"Dong",
""
],
[
"Lou",
"Jea-Hong",
""
],
[
"Ma",
"Gin-Kou",
""
],
[
"Rutenbar",
"Rob A.",
""
],
[
"Mukherjee",
"Tamal",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4723 | EDA Publishing Association | C. Soens, G. Van Der Plas, P. Wambacq, S. Donnay | Simulation Methodology for Analysis of Substrate Noise Impact on Analog
/ RF Circuits Including Interconnect Resistance | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.PF | null | This paper reports a novel simulation methodology for analysis and prediction
of substrate noise impact on analog / RF circuits taking into account the role
of the parasitic resistance of the on-chip interconnect in the impact
mechanism. This methodology allows investigation of the role of the separate
devices (also parasitic devices) in the analog / RF circuit in the overall
impact. This way is revealed which devices have to be taken care of (shielding,
topology change) to protect the circuit against substrate noise. The developed
methodology is used to analyze impact of substrate noise on a 3 GHz LC-tank
Voltage Controlled Oscillator (VCO) designed in a high-ohmic 0.18 $\mu$m 1PM6
CMOS technology. For this VCO (in the investigated frequency range from DC to
15 MHz) impact is mainly caused by resistive coupling of noise from the
substrate to the non-ideal on-chip ground interconnect, resulting in analog
ground bounce and frequency modulation. Hence, the presented test-case reveals
the important role of the on-chip interconnect in the phenomenon of substrate
noise impact.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:37:18 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Soens",
"C.",
""
],
[
"Van Der Plas",
"G.",
""
],
[
"Wambacq",
"P.",
""
],
[
"Donnay",
"S.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.PF",
"description": "Covers performance measurement and evaluation, queueing, and simulation. Roughly includes material in ACM Subject Classes D.4.8 and K.6.2.",
"span": "(Performance)"
}
] |
0710.4724 | EDA Publishing Association | L. Barrandon (IETR), S. Crand (IETR), D. Houzet (IETR) | Systematic Figure of Merit Computation for the Design of Pipeline ADC | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | The emerging concept of SoC-AMS leads to research new top-down methodologies
to aid systems designers in sizing analog and mixed devices. This work applies
this idea to the high-level optimization of pipeline ADC. Considering a given
technology, it consists in comparing different configurations according to
their imperfections and their architectures without FFT computation or
time-consuming simulations. The final selection is based on a figure of merit.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:37:45 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Barrandon",
"L.",
"",
"IETR"
],
[
"Crand",
"S.",
"",
"IETR"
],
[
"Houzet",
"D.",
"",
"IETR"
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4725 | EDA Publishing Association | Carlos Eduardo Savioli, Claudio C. Czendrodi, Jose Vicente Calvano,
Antonio Carneiro De Mesquita Filho | Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.NE | null | This issue discusses the fault-trajectory approach suitability for fault
diagnosis on analog networks. Recent works have shown promising results
concerning a method based on this concept for ATPG for diagnosing faults on
analog networks. Such method relies on evolutionary techniques, where a generic
algorithm (GA) is coded to generate a set of optimum frequencies capable to
disclose faults.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:37:48 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Savioli",
"Carlos Eduardo",
""
],
[
"Czendrodi",
"Claudio C.",
""
],
[
"Calvano",
"Jose Vicente",
""
],
[
"Filho",
"Antonio Carneiro De Mesquita",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.NE",
"description": "Covers neural networks, connectionism, genetic algorithms, artificial life, adaptive behavior. Roughly includes some material in ACM Subject Class C.1.3, I.2.6, I.5.",
"span": "(Neural and Evolutionary Computing)"
}
] |
0710.4727 | EDA Publishing Association | Paul Muller, Armin Tajalli, Mojtaba Atarodi, Yusuf Leblebici | Top-Down Design of a Low-Power Multi-Channel 2.5-Gbit/s/Channel Gated
Oscillator Clock-Recovery Circuit | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | We present a complete top-down design of a low-power multi-channel clock
recovery circuit based on gated current-controlled oscillators. The flow
includes several tools and methods used to specify block constraints, to design
and verify the topology down to the transistor level, as well as to achieve a
power consumption as low as 5mW/Gbit/s. Statistical simulation is used to
estimate the achievable bit error rate in presence of phase and frequency
errors and to prove the feasibility of the concept. VHDL modeling provides
extensive verification of the topology. Thermal noise modeling based on
well-known concepts delivers design parameters for the device sizing and
biasing. We present two practical examples of possible design improvements
analyzed and implemented with this methodology.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:38:14 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Muller",
"Paul",
""
],
[
"Tajalli",
"Armin",
""
],
[
"Atarodi",
"Mojtaba",
""
],
[
"Leblebici",
"Yusuf",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4728 | EDA Publishing Association | Jung-Chun Kao, Radu Marculescu | Energy-Aware Routing for E-Textile Applications | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | As the scale of electronic devices shrinks, "electronic textiles"
(e-textiles) will make possible a wide variety of novel applications which are
currently unfeasible. Due to the wearability concerns, low-power techniques are
critical for e-textile applications. In this paper, we address the issue of the
energy-aware routing for e-textile platforms and propose an efficient algorithm
to solve it. The platform we consider consists of dedicated components for
e-textiles, including computational modules, dedicated transmission lines and
thin-film batteries on fiber substrates. Furthermore, we derive an analytical
upper bound for the achievable number of jobs completed over all possible
routing strategies. From a practical standpoint, for the Advanced Encryption
Standard (AES) cipher, the routing technique we propose achieves about fifty
percent of this analytical upper bound. Moreover, compared to the
non-energy-aware counterpart, our routing technique increases the number of
encryption jobs completed by one order of magnitude.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:38:43 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Kao",
"Jung-Chun",
""
],
[
"Marculescu",
"Radu",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4729 | EDA Publishing Association | Saibal Mukhopadhyay, Swarup Bhunia, Kaushik Roy | Modeling and Analysis of Loading Effect in Leakage of Nano-Scaled
Bulk-CMOS Logic Circuits | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | In nanometer scaled CMOS devices significant increase in the subthreshold,
the gate and the reverse biased junction band-to-band-tunneling (BTBT) leakage,
results in the large increase of total leakage power in a logic circuit.
Leakage components interact with each other in device level (through device
geometry, doping profile) and also in the circuit level (through node
voltages). Due to the circuit level interaction of the different leakage
components, the leakage of a logic gate strongly depends on the circuit
topology i.e. number and nature of the other logic gates connected to its input
and output. In this paper, for the first time, we have analyzed loading effect
on leakage and proposed a method to accurately estimate the total leakage in a
logic circuit, from its logic level description considering the impact of
loading and transistor stacking.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:39:25 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Mukhopadhyay",
"Saibal",
""
],
[
"Bhunia",
"Swarup",
""
],
[
"Roy",
"Kaushik",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4731 | EDA Publishing Association | Yuh-Fang Tsai, Vijaykrishnan Narayaynan, Yuan Xie, Mary Jane Irwin | Leakage-Aware Interconnect for On-Chip Network | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | On-chip networks have been proposed as the interconnect fabric for future
systems-on-chip and multi-processors on chip. Power is one of the main
constraints of these systems and interconnect consumes a significant portion of
the power budget. In this paper, we propose four leakage-aware interconnect
schemes. Our schemes achieve 10.13%~63.57% active leakage savings and
12.35%~95.96% standby leakage savings across schemes while the delay penalty
ranges from 0% to 4.69%.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:40:02 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Tsai",
"Yuh-Fang",
""
],
[
"Narayaynan",
"Vijaykrishnan",
""
],
[
"Xie",
"Yuan",
""
],
[
"Irwin",
"Mary Jane",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4732 | EDA Publishing Association | Bruno Bougard, Francky Catthoor, Denis C. Daly, Anantha Chandrakasan,
Wim Dehaene | Energy Efficiency of the IEEE 802.15.4 Standard in Dense Wireless
Microsensor Networks: Modeling and Improvement Perspectives | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.NI | null | Wireless microsensor networks, which have been the topic of intensive
research in recent years, are now emerging in industrial applications. An
important milestone in this transition has been the release of the IEEE
802.15.4 standard that specifies interoperable wireless physical and medium
access control layers targeted to sensor node radios. In this paper, we
evaluate the potential of an 802.15.4 radio for use in an ultra low power
sensor node operating in a dense network. Starting from measurements carried
out on the off-the-shelf radio, effective radio activation and link adaptation
policies are derived. It is shown that, in a typical sensor network scenario,
the average power per node can be reduced down to 211m mm mW. Next, the energy
consumption breakdown between the different phases of a packet transmission is
presented, indicating which part of the transceiver architecture can most
effectively be optimized in order to further reduce the radio power, enabling
self-powered wireless microsensor networks.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:40:37 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Bougard",
"Bruno",
""
],
[
"Catthoor",
"Francky",
""
],
[
"Daly",
"Denis C.",
""
],
[
"Chandrakasan",
"Anantha",
""
],
[
"Dehaene",
"Wim",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.NI",
"description": "Covers all aspects of computer communication networks, including network architecture and design, network protocols, and internetwork standards (like TCP/IP). Also includes topics, such as web caching, that are directly relevant to Internet architecture and performance. Roughly includes all of ACM Subject Class C.2 except C.2.4, which is more likely to have Distributed, Parallel, and Cluster Computing as the primary subject area.",
"span": "(Networking and Internet Architecture)"
}
] |
0710.4733 | EDA Publishing Association | S. A. Bota, M. Rosales, J. L. Rossello, J. Segura | Smart Temperature Sensor for Thermal Testing of Cell-Based ICs | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | In this paper we present a simple and efficient built-in temperature sensor
for thermal monitoring of standard-cell based VLSI circuits. The proposed smart
temperature sensor uses a ring-oscillator composed of complex gates instead of
inverters to optimize their linearity. Simulation results from a 0.18$\mu$m
CMOS technology show that the non-linearity error of the sensor can be reduced
when an adequate set of standard logic gates is selected.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:41:13 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Bota",
"S. A.",
""
],
[
"Rosales",
"M.",
""
],
[
"Rossello",
"J. L.",
""
],
[
"Segura",
"J.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4734 | EDA Publishing Association | Eric Liau, Doris Schmitt-Landsiedel | Computational Intelligence Characterization Method of Semiconductor
Device | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AI cs.NE | null | Characterization of semiconductor devices is used to gather as much data
about the device as possible to determine weaknesses in design or trends in the
manufacturing process. In this paper, we propose a novel multiple trip point
characterization concept to overcome the constraint of single trip point
concept in device characterization phase. In addition, we use computational
intelligence techniques (e.g. neural network, fuzzy and genetic algorithm) to
further manipulate these sets of multiple trip point values and tests based on
semiconductor test equipments, Our experimental results demonstrate an
excellent design parameter variation analysis in device characterization phase,
as well as detection of a set of worst case tests that can provoke the worst
case variation, while traditional approach was not capable of detecting them.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:41:43 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Liau",
"Eric",
""
],
[
"Schmitt-Landsiedel",
"Doris",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AI",
"description": "Covers all areas of AI except Vision, Robotics, Machine Learning, Multiagent Systems, and Computation and Language (Natural Language Processing), which have separate subject areas. In particular, includes Expert Systems, Theorem Proving (although this may overlap with Logic in Computer Science), Knowledge Representation, Planning, and Uncertainty in AI. Roughly includes material in ACM Subject Classes I.2.0, I.2.1, I.2.3, I.2.4, I.2.8, and I.2.11.",
"span": "(Artificial Intelligence)"
},
{
"class": "Computer Science",
"code": "cs.NE",
"description": "Covers neural networks, connectionism, genetic algorithms, artificial life, adaptive behavior. Roughly includes some material in ACM Subject Class C.1.3, I.2.6, I.5.",
"span": "(Neural and Evolutionary Computing)"
}
] |
0710.4735 | EDA Publishing Association | Irith Pomeranz, Sudhakar M. Reddy | Worst-Case and Average-Case Analysis of n-Detection Test Sets | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Test sets that detect each target fault n times (n-detection test sets) are
typically generated for restricted values of n due to the increase in test set
size with n. We perform both a worst-case analysis and an average-case analysis
to check the effect of restricting n on the unmodeled fault coverage of an
(arbitrary) n-detection test set. Our analysis is independent of any particular
test set or test generation approach. It is based on a specific set of target
faults and a specific set of untargeted faults. It shows that, depending on the
circuit, very large values of n may be needed to guarantee the detection of all
the untargeted faults. We discuss the implications of these results.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:42:30 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Pomeranz",
"Irith",
""
],
[
"Reddy",
"Sudhakar M.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4736 | EDA Publishing Association | L. Lopez (L2MP), J. M. Portal (L2MP), D. Nee (ST-Rousset) | A New Embedded Measurement Structure for eDRAM Capacitor | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | The embedded DRAM (eDRAM) is more and more used in System On Chip (SOC). The
integration of the DRAM capacitor process into a logic process is challenging
to get satisfactory yields. The specific process of DRAM capacitor and the low
capacitance value (~30F) of this device induce problems of process monitoring
and failure analysis. We propose a new test structure to measure the
capacitance value of each DRAM cell capacitor in a DRAM array. This concept has
been validated by simulation on a 0.18$\mu$m eDRAM technology.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:42:35 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Lopez",
"L.",
"",
"L2MP"
],
[
"Portal",
"J. M.",
"",
"L2MP"
],
[
"Nee",
"D.",
"",
"ST-Rousset"
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4737 | EDA Publishing Association | Karsten Albers, Frank Slomka | Efficient Feasibility Analysis for Real-Time Systems with EDF Scheduling | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | This paper presents new fast exact feasibility tests for uniprocessor
real-time systems using preemptive EDF scheduling. Task sets which are accepted
by previously described sufficient tests will be evaluated in nearly the same
time as with the old tests by the new algorithms. Many task sets are not
accepted by the earlier tests despite them beeing feasible. These task sets
will be evaluated by the new algorithms a lot faster than with known exact
feasibility tests. Therefore it is possible to use them for many applications
for which only sufficient test are suitable. Additionally this paper shows that
the best previous known sufficient test, the best known feasibility bound and
the best known approximation algorithm can be derived from these new tests. In
result this leads to an integrated schedulability theory for EDF.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:43:23 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Albers",
"Karsten",
""
],
[
"Slomka",
"Frank",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4738 | EDA Publishing Association | Cesar Marcon, Ney Calazans, Fernando Moraes, Altamiro Susin, Igor
Reis, Fabiano Hessel | Exploring NoC Mapping Strategies: An Energy and Timing Aware Technique | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Complex applications implemented as Systems on Chip (SoCs) demand extensive
use of system level modeling and validation. Their implementation gathers a
large number of complex IP cores and advanced interconnection schemes, such as
hierarchical bus architectures or networks on chip (NoCs). Modeling
applications involves capturing its computation and communication
characteristics. Previously proposed communication weighted models (CWM)
consider only the application communication aspects. This work proposes a
communication dependence and computation model (CDCM) that can simultaneously
consider both aspects of an application. It presents a solution to the problem
of mapping applications on regular NoCs while considering execution time and
energy consumption. The use of CDCM is shown to provide estimated average
reductions of 40% in execution time, and 20% in energy consumption, for current
technologies.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:43:59 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Marcon",
"Cesar",
""
],
[
"Calazans",
"Ney",
""
],
[
"Moraes",
"Fernando",
""
],
[
"Susin",
"Altamiro",
""
],
[
"Reis",
"Igor",
""
],
[
"Hessel",
"Fabiano",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4739 | EDA Publishing Association | Min Li, Xiaobo Wu, Richard Yao, Xiaolang Yan | Q-DPM: An Efficient Model-Free Dynamic Power Management Technique | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | When applying Dynamic Power Management (DPM) technique to pervasively
deployed embedded systems, the technique needs to be very efficient so that it
is feasible to implement the technique on low end processor and tight-budget
memory. Furthermore, it should have the capability to track time varying
behavior rapidly because the time varying is an inherent characteristic of real
world system. Existing methods, which are usually model-based, may not satisfy
the aforementioned requirements. In this paper, we propose a model-free DPM
technique based on Q-Learning. Q-DPM is much more efficient because it removes
the overhead of parameter estimator and mode-switch controller. Furthermore,
its policy optimization is performed via consecutive online trialing, which
also leads to very rapid response to time varying behavior.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:44:34 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Li",
"Min",
""
],
[
"Wu",
"Xiaobo",
""
],
[
"Yao",
"Richard",
""
],
[
"Yan",
"Xiaolang",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4740 | EDA Publishing Association | Horst Brinkmeyer | A New Approach to Component Testing | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | Carefully tested electric/electronic components are a requirement for
effective hardware-in-the-loop tests and vehicle tests in automotive industry.
A new method for definition and execution of component tests is described. The
most important advantage of this method is independance from the test stand. It
therefore offers the oppportunity to build up knowledge over a long period of
time and the ability to share this knowledge with different partners.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:45:00 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Brinkmeyer",
"Horst",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4742 | EDA Publishing Association | Joel Coburn, Srivaths Ravi, Anand Raghunathan | Hardware Accelerated Power Estimation | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | In this paper, we present power emulation, a novel design paradigm that
utilizes hardware acceleration for the purpose of fast power estimation. Power
emulation is based on the observation that the functions necessary for power
estimation (power model evaluation, aggregation, etc.) can be implemented as
hardware circuits. Therefore, we can enhance any given design with "power
estimation hardware", map it to a prototyping platform, and exercise it with
any given test stimuli to obtain power consumption estimates. Our empirical
studies with industrial designs reveal that power emulation can achieve
significant speedups (10X to 500X) over state-of-the-art commercial
register-transfer level (RTL) power estimation tools.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:45:28 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Coburn",
"Joel",
""
],
[
"Ravi",
"Srivaths",
""
],
[
"Raghunathan",
"Anand",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4743 | EDA Publishing Association | Alan Mishchenko, Robert Brayton, Roland Jiang, Tiziano Villa, Nina
Yevtushenko | Efficient Solution of Language Equations Using Partitioned
Representations | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.LO | null | A class of discrete event synthesis problems can be reduced to solving
language equations f . X ⊆ S, where F is the fixed component and S the
specification. Sequential synthesis deals with FSMs when the automata for F and
S are prefix closed, and are naturally represented by multi-level networks with
latches. For this special case, we present an efficient computation, using
partitioned representations, of the most general prefix-closed solution of the
above class of language equations. The transition and the output relations of
the FSMs for F and S in their partitioned form are represented by the sets of
output and next state functions of the corresponding networks. Experimentally,
we show that using partitioned representations is much faster than using
monolithic representations, as well as applicable to larger problem instances.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:45:31 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Mishchenko",
"Alan",
""
],
[
"Brayton",
"Robert",
""
],
[
"Jiang",
"Roland",
""
],
[
"Villa",
"Tiziano",
""
],
[
"Yevtushenko",
"Nina",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.LO",
"description": "Covers all aspects of logic in computer science, including finite model theory, logics of programs, modal logic, and program verification. Programming language semantics should have Programming Languages as the primary subject area. Roughly includes material in ACM Subject Classes D.2.4, F.3.1, F.4.0, F.4.1, and F.4.2; some material in F.4.3 (formal languages) may also be appropriate here, although Computational Complexity is typically the more appropriate subject area.",
"span": "(Logic in Computer Science)"
}
] |
0710.4745 | EDA Publishing Association | Joachim Langenwalter | Embedded Automotive System Development Process | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | Model based design enables the automatic generation of final-build software
from models for high-volume automotive embedded systems. This paper presents a
framework of processes, methods and tools for the design of automotive embedded
systems. A steer-by-wire system serves as an example.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:46:11 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Langenwalter",
"Joachim",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4746 | EDA Publishing Association | M. Abdelsalam Hassan, Keishi Sakanushi, Yoshinori Takeuchi, Masaharu
Imai | RTK-Spec TRON: A Simulation Model of an ITRON Based RTOS Kernel in
SystemC | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OS | null | This paper presents the methodology and the modeling constructs we have
developed to capture the real time aspects of RTOS simulation models in a
System Level Design Language (SLDL) like SystemC. We describe these constructs
and show how they are used to build a simulation model of an RTOS kernel
targeting the $\mu$-ITRON OS specification standard.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:47:35 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Hassan",
"M. Abdelsalam",
""
],
[
"Sakanushi",
"Keishi",
""
],
[
"Takeuchi",
"Yoshinori",
""
],
[
"Imai",
"Masaharu",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OS",
"description": "Roughly includes material in ACM Subject Classes D.4.1, D.4.2., D.4.3, D.4.4, D.4.5, D.4.7, and D.4.9.",
"span": "(Operating Systems)"
}
] |
0710.4747 | EDA Publishing Association | Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey | An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Memory cores are usually the densest portion with the smallest feature size
in system-on-chip (SOC) designs. The reliability of memory cores thus has heavy
impact on the reliability of SOCs. Transparent test is one of useful technique
for improving the reliability of memories during life time. This paper presents
a systematic algorithm used for transforming a bit-oriented march test into a
transparent word-oriented march test. The transformed transparent march test
has shorter test complexity compared with that proposed in the previous works
[Theory of transparent BIST for RAMs, A transparent online memory test for
simultaneous detection of functional faults and soft errors in memories]. For
example, if a memory with 32-bit words is tested with March C-, time complexity
of the transparent word-oriented test transformed by the proposed scheme is
only about 56% or 19% time complexity of the transparent word-oriented test
converted by the scheme reported in [Theory of transparent BIST for RAMs] or [A
transparent online memory test for simultaneous detection of functional faults
and soft errors in memories], respectively.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:48:22 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Li",
"Jin-Fu",
""
],
[
"Tseng",
"Tsu-Wei",
""
],
[
"Wey",
"Chin-Long",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4748 | EDA Publishing Association | Wolfgang Klingauf | Systematic Transaction Level Modeling of Embedded Systems with SystemC | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper gives an overview of a transaction level modeling (TLM) design
flow for straightforward embedded system design with SystemC. The goal is to
systematically develop both application-specific HW and SW components of an
embedded system using the TLM approach, thus allowing for fast communication
architecture exploration, rapid prototyping and early embedded SW development.
To this end, we specify the lightweight transaction-based communication
protocol SHIP and present a methodology for automatic mapping of the
communication part of a system to a given architecture, including HW/SW
interfaces.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:49:10 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Klingauf",
"Wolfgang",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4750 | EDA Publishing Association | L. Schiano, M. Ottavi, F. Lombardi, S. Pontarelli, A. Salsano | On the Analysis of Reed Solomon Coding for Resilience to
Transient/Permanent Faults in Highly Reliable Memories | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.IT math.IT | null | Single Event Upsets (SEU) as well as permanent faults can significantly
affect the correct on-line operation of digital systems, such as memories and
microprocessors; a memory can be made resilient to permanent and transient
faults by using modular redundancy and coding. In this paper, different memory
systems are compared: these systems utilize simplex and duplex arrangements
with a combination of Reed Solomon coding and scrubbing. The memory systems and
their operations are analyzed by novel Markov chains to characterize
performance for dynamic reconfiguration as well as error detection and
correction under the occurrence of permanent and transient faults. For a
specific Reed Solomon code, the duplex arrangement allows to efficiently cope
with the occurrence of permanent faults, while the use of scrubbing allows to
cope with transient faults.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:50:12 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Schiano",
"L.",
""
],
[
"Ottavi",
"M.",
""
],
[
"Lombardi",
"F.",
""
],
[
"Pontarelli",
"S.",
""
],
[
"Salsano",
"A.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.IT",
"description": "Covers theoretical and experimental aspects of information theory and coding. Includes material in ACM Subject Class E.4 and intersects with H.1.1.",
"span": "(Information Theory)"
},
{
"class": "Mathematics",
"code": "math.IT",
"description": "math.IT is an alias for cs.IT. Covers theoretical and experimental aspects of information theory and coding.",
"span": "(Information Theory)"
}
] |
0710.4751 | EDA Publishing Association | Lars Wehmeyer, Peter Marwedel | Influence of Memory Hierarchies on Predictability for Time Constrained
Embedded Software | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Safety-critical embedded systems having to meet real-time constraints are
expected to be highly predictable in order to guarantee at design time that
certain timing deadlines will always be met. This requirement usually prevents
designers from utilizing caches due to their highly dynamic, thus hardly
predictable behavior. The integration of scratchpad memories represents an
alternative approach which allows the system to benefit from a performance gain
comparable to that of caches while at the same time maintaining predictability.
In this work, we compare the impact of scratchpad memories and caches on worst
case execution time (WCET) analysis results. We show that caches, despite
requiring complex techniques, can have a negative impact on the predicted WCET,
while the estimated WCET for scratchpad memories scales with the achieved
Performance gain at no extra analysis cost.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:51:11 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Wehmeyer",
"Lars",
""
],
[
"Marwedel",
"Peter",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4752 | EDA Publishing Association | Jawad Khan, Ranga Vemuri | An Iterative Algorithm for Battery-Aware Task Scheduling on Portable
Computing Platforms | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | In this work we consider battery powered portable systems which either have
Field Programmable Gate Arrays (FPGA) or voltage and frequency scalable
processors as their main processing element. An application is modeled in the
form of a precedence task graph at a coarse level of granularity. We assume
that for each task in the task graph several unique design-points are available
which correspond to different hardware implementations for FPGAs and different
voltage-frequency combinations for processors. It is assumed that performance
and total power consumption estimates for each design-point are available for
any given portable platfrom, including the peripheral components such as memory
and display power usage. We present an iterative heuristic algorithm which
finds a sequence of tasks along with an appropriate design-point for each task,
such that a deadline is met and the amount of battery energy used is as small
as possible. A detailed illustrative example along with a case study of a
real-world application of a robotic arm controller which demonstrates the
usefulness of our algorithm is also presented.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:51:50 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Khan",
"Jawad",
""
],
[
"Vemuri",
"Ranga",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4753 | EDA Publishing Association | Reinhold Heckmann, Christian Ferdinand | Verifying Safety-Critical Timing and Memory-Usage Properties of Embedded
Software by Abstract Interpretation | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.LO | null | Static program analysis by abstract interpretation is an efficient method to
determine properties of embedded software. One example is value analysis, which
determines the values stored in the processor registers. Its results are used
as input to more advanced analyses, which ultimately yield information about
the stack usage and the timing behavior of embedded software.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:52:50 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Heckmann",
"Reinhold",
""
],
[
"Ferdinand",
"Christian",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.LO",
"description": "Covers all aspects of logic in computer science, including finite model theory, logics of programs, modal logic, and program verification. Programming language semantics should have Programming Languages as the primary subject area. Roughly includes material in ACM Subject Classes D.2.4, F.3.1, F.4.0, F.4.1, and F.4.2; some material in F.4.3 (formal languages) may also be appropriate here, although Computational Complexity is typically the more appropriate subject area.",
"span": "(Logic in Computer Science)"
}
] |
0710.4754 | EDA Publishing Association | Philippe Martin | Design of a Virtual Component Neutral Network-on-Chip Transaction Layer | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Research studies have demonstrated the feasibility and advantages of
Network-on-Chip (NoC) over traditional bus-based architectures but have not
focused on compatibility communication standards. This paper describes a number
of issues faced when designing a VC-neutral NoC, i.e. compatible with standards
such as AHB 2.0, AXI, VCI, OCP, and various other proprietary protocols, and
how a layered approach to communication helps solve these issues.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:52:56 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Martin",
"Philippe",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4755 | EDA Publishing Association | Fernando Rincon, Francisco Moya, Jesus Barba, Juan Carlos Lopez | Model Reuse through Hardware Design Patterns | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.SE | null | Increasing reuse opportunities is a well-known problem for software designers
as well as for hardware designers. Nonetheless, current software and hardware
engineering practices have embraced different approaches to this problem.
Software designs are usually modelled after a set of proven solutions to
recurrent problems called design patterns. This approach differs from the
component-based reuse usually found in hardware designs: design patterns do not
specify unnecessary implementation details. Several authors have already
proposed translating structural design patterns concepts to hardware design. In
this paper we extend the discussion to behavioural design patterns.
Specifically, we describe how the hardware version of the Iterator can be used
to enhance model reuse.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:53:16 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Rincon",
"Fernando",
""
],
[
"Moya",
"Francisco",
""
],
[
"Barba",
"Jesus",
""
],
[
"Lopez",
"Juan Carlos",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.SE",
"description": "Covers design tools, software metrics, testing and debugging, programming environments, etc. Roughly includes material in all of ACM Subject Classes D.2, except that D.2.4 (program verification) should probably have Logics in Computer Science as the primary subject area.",
"span": "(Software Engineering)"
}
] |
0710.4756 | EDA Publishing Association | Kris Tiri, Ingrid Verbauwhede | Design Method for Constant Power Consumption of Differential Logic
Circuits | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.CR | null | Side channel attacks are a major security concern for smart cards and other
embedded devices. They analyze the variations on the power consumption to find
the secret key of the encryption algorithm implemented within the security IC.
To address this issue, logic gates that have a constant power dissipation
independent of the input signals, are used in security ICs. This paper presents
a design methodology to create fully connected differential pull down networks.
Fully connected differential pull down networks are transistor networks that
for any complementary input combination connect all the internal nodes of the
network to one of the external nodes of the network. They are memoryless and
for that reason have a constant load capacitance and power consumption. This
type of networks is used in specialized logic gates to guarantee a constant
contribution of the internal nodes into the total power consumption of the
logic gate.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:53:18 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Tiri",
"Kris",
""
],
[
"Verbauwhede",
"Ingrid",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.CR",
"description": "Covers all areas of cryptography and security including authentication, public key cryptosytems, proof-carrying code, etc. Roughly includes material in ACM Subject Classes D.4.6 and E.3.",
"span": "(Cryptography and Security)"
}
] |
0710.4757 | EDA Publishing Association | Celia Lopez-Ongil, Mario Garcia-Valderas, Marta Portela-Garcia, Luis
Entrena-Arrontes | Techniques for Fast Transient Fault Grading Based on Autonomous
Emulation | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Very deep submicron and nanometer technologies have increased notably
integrated circuit (IC) sensitiveness to radiation. Soft errors are currently
appearing into ICs working at earth surface. Hardened circuits are currently
required in many applications where Fault Tolerance (FT) was not a requirement
in the very near past. The use of platform FPGAs for the emulation of
single-event upset effects (SEU) is gaining attention in order to speed up the
FT evaluation. In this work, a new emulation system for FT evaluation with
respect to SEU effects is proposed, providing shorter evaluation times by
performing all the evaluation process in the FPGA and avoiding emulator-host
communication bottlenecks.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:53:37 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Lopez-Ongil",
"Celia",
""
],
[
"Garcia-Valderas",
"Mario",
""
],
[
"Portela-Garcia",
"Marta",
""
],
[
"Entrena-Arrontes",
"Luis",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4758 | EDA Publishing Association | Lap-Fai Leung, Chi-Ying Tsui, Xiaobo Sharon Hu | Exploiting Dynamic Workload Variation in Low Energy Preemptive Task
Scheduling | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | A novel energy reduction strategy to maximally exploit the dynamic workload
variation is proposed for the offline voltage scheduling of preemptive systems.
The idea is to construct a fully-preemptive schedule that leads to minimum
energy consumption when the tasks take on approximately the average execution
cycles yet still guarantees no deadline violation during the worst-case
scenario. End-time for each sub-instance of the tasks obtained from the
schedule is used for the on-line dynamic voltage scaling (DVS) of the tasks.
For the tasks that normally require a small number of cycles but occasionally a
large number of cycles to complete, such a schedule provides more opportunities
for slack utilization and hence results in larger energy saving. The concept is
realized by formulating the problem as a Non-Linear Programming (NLP)
optimization problem. Experimental results show that, by using the proposed
scheme, the total energy consumption at runtime is reduced by as high as 60%
for randomly generated task sets when comparing with the static scheduling
approach only using worst case workload.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:53:59 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Leung",
"Lap-Fai",
""
],
[
"Tsui",
"Chi-Ying",
""
],
[
"Hu",
"Xiaobo Sharon",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4759 | EDA Publishing Association | J. L. Rossello, V. Canals, S. A. Bota, A. Keshavarzi, J. Segura | A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | As technology scales down, the static power is expected to become a
significant fraction of the total power. The exponential dependence of static
power with the operating temperature makes the thermal profile estimation of
high-performance ICs a key issue to compute the total power dissipated in
next-generations. In this paper we present accurate and compact analytical
models to estimate the static power dissipation and the temperature of
operation of CMOS gates. The models are the fundamentals of a performance
estimation tool in which numerical procedures are avoided for any computation
to set a faster estimation and optimization. The models developed are compared
to measurements and SPICE simulations for a 0.12mm technology showing excellent
results.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:54:18 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Rossello",
"J. L.",
""
],
[
"Canals",
"V.",
""
],
[
"Bota",
"S. A.",
""
],
[
"Keshavarzi",
"A.",
""
],
[
"Segura",
"J.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4760 | EDA Publishing Association | A. Verle (LIRMM), X. Michel (LIRMM), N. Azemard (LIRMM), P. Maurine
(LIRMM), D. Auvergne (LIRMM) | Low Power Oriented CMOS Circuit Optimization Protocol | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Low power oriented circuit optimization consists in selecting the best
alternative between gate sizing, buffer insertion and logic structure
transformation, for satisfying a delay constraint at minimum area cost. In this
paper we used a closed form model of delay in CMOS structures to define metrics
for a deterministic selection of the optimization alternative. The target is
delay constraint satisfaction with minimum area cost. We validate the design
space exploration method, defining maximum and minimum delay bounds on logical
paths. Then we adapt this method to a "constant sensitivity method" allowing to
size a circuit at minimum area under a delay constraint. An optimisation
protocol is finally defined to manage the trade-off performance constraint -
circuit structure. These methods are implemented in an optimization tool (POPS)
and validated by comparing on a 0.25$\mu$m process, the optimization efficiency
obtained on various benchmarks (ISCAS?85) to that resulting from an industrial
tool.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:54:46 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Verle",
"A.",
"",
"LIRMM"
],
[
"Michel",
"X.",
"",
"LIRMM"
],
[
"Azemard",
"N.",
"",
"LIRMM"
],
[
"Maurine",
"P.",
"",
"LIRMM"
],
[
"Auvergne",
"D.",
"",
"LIRMM"
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4761 | EDA Publishing Association | D. C. Keezer, C. Gray, A. Majid, N. Taher | Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper describes two research projects that develop new low-cost
techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals.
Each project uses commercially available components to keep costs low, yet
achieves performance characteristics comparable to (and in some ways exceeding)
more expensive ATE. A common CMOS FPGA-based logic core provides flexibility,
adaptability, and communication with controlling computers while customized
positive emitter-coupled logic (PECL) achieves multi-gigahertz data rates with
about $\pm$25ps timing accuracy.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:55:04 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Keezer",
"D. C.",
""
],
[
"Gray",
"C.",
""
],
[
"Majid",
"A.",
""
],
[
"Taher",
"N.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4762 | EDA Publishing Association | Takeshi Kitahara, Naoyuki Kawabe, Fimihiro Minami, Katsuhiro Seta,
Toshiyuki Furusawa | Area-Efficient Selective Multi-Threshold CMOS Design Methodology for
Standby Leakage Power Reduction | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper presents a design flow for an improved selective
multi-threshold(Selective-MT) circuit. The Selective-MT circuit is improved so
that plural MT-cells can share one switch transistor. We propose the design
methodology from RTL(Register Transfer Level) to final layout with optimizing
switch transistor structure.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:55:21 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Kitahara",
"Takeshi",
""
],
[
"Kawabe",
"Naoyuki",
""
],
[
"Minami",
"Fimihiro",
""
],
[
"Seta",
"Katsuhiro",
""
],
[
"Furusawa",
"Toshiyuki",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4763 | EDA Publishing Association | Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang
Lin, Ron Press | Logic Design for On-Chip Test Clock Generation - Implementation Details
and Impact on Delay Test Quality | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | This paper addresses delay test for SOC devices with high frequency clock
domains. A logic design for on-chip high-speed clock generation, implemented to
avoid expensive test equipment, is described in detail. Techniques for on-chip
clock generation, meant to reduce test vector count and to increase test
quality, are discussed. ATPG results for the proposed techniques are given.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:55:27 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Beck",
"Matthias",
""
],
[
"Barondeau",
"Olivier",
""
],
[
"Kaibel",
"Martin",
""
],
[
"Poehl",
"Frank",
""
],
[
"Lin",
"Xijiang",
""
],
[
"Press",
"Ron",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4764 | EDA Publishing Association | G. M. Link, N. Vijaykrishnan | Hotspot Prevention Through Runtime Reconfiguration in Network-On-Chip | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Many existing thermal management techniques focus on reducing the overall
power consumption of the chip, and do not address location-specific temperature
problems referred to as hotspots. We propose the use of dynamic runtime
reconfiguration to shift the hotspot-inducing computation periodically and make
the thermal profile more uniform. Our analysis shows that dynamic
reconfiguration is an effective technique in reducing hotspots for NoCs.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 09:55:48 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Link",
"G. M.",
""
],
[
"Vijaykrishnan",
"N.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4780 | Jesus M. Almendros-Jimenez Dr. | J. M. Almendros-Jim\'enez and A. Becerra-Ter\'on and F. J.
Enciso-Ba\~nos | Querying XML Documents in Logic Programming | null | null | null | null | cs.PL cs.DB | null | Extensible Markup Language (XML) is a simple, very flexible text format
derived from SGML. Originally designed to meet the challenges of large-scale
electronic publishing, XML is also playing an increasingly important role in
the exchange of a wide variety of data on the Web and elsewhere. XPath language
is the result of an effort to provide address parts of an XML document. In
support of this primary purpose, it becomes in a query language against an XML
document. In this paper we present a proposal for the implementation of the
XPath language in logic programming. With this aim we will describe the
representation of XML documents by means of a logic program. Rules and facts
can be used for representing the document schema and the XML document itself.
In particular, we will present how to index XML documents in logic programs:
rules are supposed to be stored in main memory, however facts are stored in
secondary memory by using two kind of indexes: one for each XML tag, and other
for each group of terminal items. In addition, we will study how to query by
means of the XPath language against a logic program representing an XML
document. It evolves the specialization of the logic program with regard to the
XPath expression. Finally, we will also explain how to combine the indexing and
the top-down evaluation of the logic program. To appear in Theory and Practice
of Logic Programming (TPLP)"
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 10:45:08 GMT"
}
] | 2007-10-26T00:00:00 | [
[
"Almendros-Jiménez",
"J. M.",
""
],
[
"Becerra-Terón",
"A.",
""
],
[
"Enciso-Baños",
"F. J.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.PL",
"description": "Covers programming language semantics, language features, programming approaches (such as object-oriented programming, functional programming, logic programming). Also includes material on compilers oriented towards programming languages; other material on compilers may be more appropriate in Architecture (AR). Roughly includes material in ACM Subject Classes D.1 and D.3.",
"span": "(Programming Languages)"
},
{
"class": "Computer Science",
"code": "cs.DB",
"description": "Covers database management, datamining, and data processing. Roughly includes material in ACM Subject Classes E.2, E.5, H.0, H.2, and J.1.",
"span": "(Databases)"
}
] |
0710.4793 | EDA Publishing Association | He Hai, Zhong Yi-Fang, Cai Chi-Lan | Unified Modeling of Complex Real-Time Control Systems | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.SE | null | Complex real-time control system is a software dense and algorithms dense
system, which needs modern software engineering techniques to design. UML is an
object-oriented industrial standard modeling language, used more and more in
real-time domain. This paper first analyses the advantages and problems of
using UML for real-time control systems design. Then, it proposes an extension
of UML-RT to support time-continuous subsystems modeling. So we can unify
modeling of complex real-time control systems on UML-RT platform, from
requirement analysis, model design, simulation, until generation code.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 11:50:54 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Hai",
"He",
""
],
[
"Yi-Fang",
"Zhong",
""
],
[
"Chi-Lan",
"Cai",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.SE",
"description": "Covers design tools, software metrics, testing and debugging, programming environments, etc. Roughly includes material in all of ACM Subject Classes D.2, except that D.2.4 (program verification) should probably have Logics in Computer Science as the primary subject area.",
"span": "(Software Engineering)"
}
] |
0710.4794 | EDA Publishing Association | Robert Bai, Nam-Sung Kim, Tae Ho Kgil, Dennis Sylvester, Trevor Mudge | Power-Performance Trade-Offs in Nanometer-Scale Multi-Level Caches
Considering Total Leakage | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | In this paper, we investigate the impact of T_{ox} and Vth on power
performance trade-offs for on-chip caches. We start by examining the
optimization of the various components of a single level cache and then extend
this to two level cache systems. In addition to leakage, our studies also
account for the dynamic power expanded as a result of cache misses. Our results
show that one can often reduce overall power by increasing the size of the L2
cache if we only allow one pair of Vth/T_{ox} in L2. However, if we allow the
memory cells and the peripherals to have their own Vth's and T_{ox}'s, we show
that a two-level cache system with smaller L2's will yield less total leakage.
We further show that two Vth's and two T_{ox}'s are sufficient to get close to
an optimal solution, and that Vth is generally a better design knob than T_{ox}
for leakage optimization, thus it is better to restrict the number of T_{ox}'s
rather than Vth's if cost is a concern.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 11:51:44 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Bai",
"Robert",
""
],
[
"Kim",
"Nam-Sung",
""
],
[
"Kgil",
"Tae Ho",
""
],
[
"Sylvester",
"Dennis",
""
],
[
"Mudge",
"Trevor",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4795 | EDA Publishing Association | Alexandre M. Amory, Marcelo Lubaszewski, Fernando G. Moraes, Edson I.
Moreno | Test Time Reduction Reusing Multiple Processors in a Network-on-Chip
Based Architecture | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | The increasing complexity and the short life cycles of embedded systems are
pushing the current system-on-chip designs towards a rapid increasing on the
number of programmable processing units, while decreasing the gate count for
custom logic. Considering this trend, this work proposes a test planning method
capable of reusing available processors as test sources and sinks, and the
on-chip network as the test access mechanism. Experimental results are based on
ITC'02 benchmarks and on two open core processors compliant with MIPS and SPARC
instruction set. The results show that the cooperative use of both the on-chip
network and the embedded processors can increase the test parallelism and
reduce the test time without additional cost in area and pins.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 11:52:22 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Amory",
"Alexandre M.",
""
],
[
"Lubaszewski",
"Marcelo",
""
],
[
"Moraes",
"Fernando G.",
""
],
[
"Moreno",
"Edson I.",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4796 | EDA Publishing Association | Javier Resano, Daniel Mozos, Francky Catthoor | A Hybrid Prefetch Scheduling Heuristic to Minimize at Run-Time the
Reconfiguration Overhead of Dynamically Reconfigurable Hardware | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.AR | null | Due to the emergence of highly dynamic multimedia applications there is a
need for flexible platforms and run-time scheduling support for embedded
systems. Dynamic Reconfigurable Hardware (DRHW) is a promising candidate to
provide this flexibility but, currently, not sufficient run-time scheduling
support to deal with the run-time reconfigurations exists. Moreover, executing
at run-time a complex scheduling heuristic to provide this support may generate
an excessive run-time penalty. Hence, we have developed a hybrid
design/run-time prefetch heuristic that schedules the reconfigurations at
run-time, but carries out the scheduling computations at design-time by
carefully identifying a set of near-optimal schedules that can be selected at
run-time. This approach provides run-time flexibility with a negligible
penalty.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 11:53:03 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Resano",
"Javier",
""
],
[
"Mozos",
"Daniel",
""
],
[
"Catthoor",
"Francky",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.AR",
"description": "Covers systems organization and hardware architecture. Roughly includes material in ACM Subject Classes C.0, C.1, and C.5.",
"span": "(Hardware Architecture)"
}
] |
0710.4797 | EDA Publishing Association | Paul Rosinger, Bashir Al-Hashimi, Krishnendu Chakrabarty | Rapid Generation of Thermal-Safe Test Schedules | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | Overheating has been acknowledged as a major issue in testing complex SOCs.
Several power constrained system-level DFT solutions (power constrained test
scheduling) have recently been proposed to tackle this problem. However, as it
will be shown in this paper, imposing a chip-level maximum power constraint
doesn't necessarily avoid local overheating due to the non-uniform distribution
of power across the chip. This paper proposes a new approach for dealing with
overheating during test, by embedding thermal awareness into test scheduling.
The proposed approach facilitates rapid generation of thermal-safer test
schedules without requiring time-consuming thermal simulations. This is
achieved by employing a low-complexity test session thermal model used to guide
the test schedule generation algorithm. This approach reduces the chances of a
design re-spin due to potential overheating during test.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 11:53:38 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Rosinger",
"Paul",
""
],
[
"Al-Hashimi",
"Bashir",
""
],
[
"Chakrabarty",
"Krishnendu",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
0710.4798 | EDA Publishing Association | Ryan Mannion, Harry Hsieh, Susan Cotterell, Frank Vahid | System Synthesis for Networks of Programmable Blocks | Submitted on behalf of EDAA (http://www.edaa.com/) | Dans Design, Automation and Test in Europe - DATE'05, Munich :
Allemagne (2005) | null | null | cs.OH | null | The advent of sensor networks presents untapped opportunities for synthesis.
We examine the problem of synthesis of behavioral specifications into networks
of programmable sensor blocks. The particular behavioral specification we
consider is an intuitive user-created network diagram of sensor blocks, each
block having a pre-defined combinational or sequential behavior. We synthesize
this specification to a new network that utilizes a minimum number of
programmable blocks in place of the pre-defined blocks, thus reducing network
size and hence network cost and power. We focus on the main task of this
synthesis problem, namely partitioning pre-defined blocks onto a minimum number
of programmable blocks, introducing the efficient but effective PareDown
decomposition algorithm for the task. We describe the synthesis and simulation
tools we developed. We provide results showing excellent network size
reductions through such synthesis, and significant speedups of our algorithm
over exhaustive search while obtaining near-optimal results for 15 real network
designs as well as nearly 10,000 randomly generated designs.
| [
{
"version": "v1",
"created": "Thu, 25 Oct 2007 11:54:15 GMT"
}
] | 2011-11-09T00:00:00 | [
[
"Mannion",
"Ryan",
""
],
[
"Hsieh",
"Harry",
""
],
[
"Cotterell",
"Susan",
""
],
[
"Vahid",
"Frank",
""
]
] | [
{
"class": "Computer Science",
"code": "cs.OH",
"description": "This is the classification to use for documents that do not fit anywhere else.",
"span": "(Other Computer Science)"
}
] |
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