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Utilizing_Generative_AI_for_automated_wafer_defect_inspection
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Utilizing_Generative_AI_for_automated_wafer_defect_inspection
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History:
13 commits
WhiteWolf21
update: version 1.1
e204c8d
about 1 year ago
app_pages
update: version 1.1
about 1 year ago
.gitattributes
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1.52 kB
initial commit
about 1 year ago
README.md
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298 Bytes
initial commit
about 1 year ago
Saitama_Team_Presentation_Page1.png
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147 kB
update: version 2
about 1 year ago
Saitama_Team_Presentation_Page2.png
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821 kB
update: version 1.1
about 1 year ago
app.py
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449 Bytes
update: version 2
about 1 year ago
multipage.py
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2.34 kB
update: version 2
about 1 year ago
packages.txt
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14 Bytes
add: packages.txt for activate custom package install
about 1 year ago
requirements.txt
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31 Bytes
update: version 2
about 1 year ago
w3.jpg
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95.7 kB
Initialization
about 1 year ago
